RICHTER, WOLFGANG
Dettaglio
RICHTER, WOLFGANG
ex-Dipartimento di Fisica
Pubblicazioni
Risultati 1 - 20 di 26 (tempo di esecuzione: 0.001 secondi).
Data di pubblicazione | Titolo | Autore(i) | Tipo | File | |
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1 | 1996 | A reflectance anisotropy spectroscopy study of GaSb(100)c(2x6) surfaces prepared by Sb decapping | Goletti, C ; Resch-Esser, U ; Foeller, J ; Esser, N ; Richter, W ; Brar, B ; Kroemer, H | Intervento a convegno | - |
2 | 2009 | Adsorption structure of cyclopentene on InP(001)(2x4) | Passmann, R; Favero, P; Schmidt, WG; Miotto, R; Braun, W; Richter, W; Kneissl, M; Esser, N; Vogt, P | Articolo su rivista | - |
3 | 2008 | Adsorption structure of cyclopentene on InP(001)(2×4) | Passman, R; Favero, P; Schmidt, WG; Miotto, R; braun,W; Richter, W et al | Articolo su rivista | - |
4 | 2001 | Analysis of InAs(001) surfaces by reflectance anisotropy spectroscopy | Goletti, C ; Arciprete, F ; Almaviva, S ; Chiaradia, P ; Esser, N ; Richter, W | Articolo su rivista | - |
5 | 2002 | Ge growth on GaAs(001) surfaces studied by reflectance anisotropy spectroscopy | Emiliani, V ; Frisch, AM ; Goletti, C ; Esser, N ; Richter, W ; Fimland, BO | Articolo su rivista | - |
6 | 1999 | Ge/GaAs(001) interface formation investigated by reflectance anisotropy spectroscopy | Emiliani, V ; Shkrebtii, AI ; Goletti, C ; Frisch, AM ; Fimland, BO ; Esser, N ; Richter, W | Articolo su rivista | - |
7 | 2009 | Identification of van Hove singularities in the GaN dielectric function: a comparison of the cubic and hexagonal phase | Cobet, C; Goldhahn, R; Richter, W; Esser, N | Articolo su rivista | - |
8 | 2011 | Inner composition, defects and morphology of AlGaAs nanowires grown by Au-catalyzed MOVPE | Prete, P; Buick, B; Speiser, E; Lovergine, N; Richter, W | Intervento a convegno | - |
9 | 18-dic-2006 | Large photocurrent generation in multiwall carbon nanotubes | Castrucci, P; Tombolini, F; Scarselli, Ma; Speiser, E; Del Gobbo, S; Richter, W; DE CRESCENZI, M; Diociaiuti, M; Gatto, E; Venanzi, M | Articolo su rivista | Solo autorizzati |
10 | 2010 | Lattice Dynamics and the Optical Properties of Semiconductors: Theory of the Temperature Dependent Dielectric Functions of GaAs and Si and Comparison with Experiment | Ibrahim, ZA; Shkrebtii, AI; Lee, MJG; Teatro, T; Drago, M; Trepk, T; Richter, W | Intervento a convegno | - |
11 | 2010 | Metal–insulator transition in Si(111)-(4 × 1)/(8 × 2)-In studied by optical spectroscopy | Speiser, E; Chandola, S; Hinrichs, K; Gensch, M; Cobet, C; Wippermann, S; Schmidt, W G; Bechstedt, F; Richter, W; Fleischer, K; McGilp, J F; Esser, N | Articolo su rivista | - |
12 | 2011 | Nearly 100 years of Raman scattering | Richter, W | Intervento a convegno | - |
13 | 1997 | Optical anisotropies of InP(001) surfaces | Goletti, C; Esser, N; Resch-Esser, U; Wagner, V; Foeller, J; Pristovsek, M; Richter, W | Articolo su rivista | - |
14 | 2004 | Optical anisotropy of Cs nanostructures on III-V(110) surfaces | Fleischer, K; Bussetti, G; Goletti, C; Richter, W; Chiaradia, P | Articolo su rivista | - |
15 | 2007 | Optical anisotropy of cyclopentene terminated GaAs(001) surfaces | Passmann, R; Kropp, M; Bruhn, T; Fimland, BO; Bloom, FL; Gossard, AC; Richter, W; Esser, N; Vogt, P | Articolo su rivista | - |
16 | 2000 | Optical characterization of indium-terminated GaAs(001) surfaces | Goletti, C; Springer, C; Resch-Esser, U; Esser, N; Richter, W; Fimland, BO | Articolo su rivista | - |
17 | 2010 | Optical spectra of ZnO in the far UV: First Principle Calculations and Ellipsometric measurements | Gori, P; Rakel, M; Cobet, C; Richter, W; Esser, N; Hoffmann, A; Del Sole, R; Cricenti, A; Pulci, O | Articolo su rivista | riservati |
18 | 2003 | Sb-induced (1x1) reconstruction on Si(001) | Power, JR; Pulci, O; Shkrebtii, AI; Galata, S; Astropekakis, A; Hinrichs, K; Esser, N ; Del Sole, R; Richter, W | Articolo su rivista | - |
19 | 2010 | Single AlxGa1-xAs Nanowires Probed by Raman Spectroscopy | Buick, B; Paiano, P; Prete, P; Speiser, E; Lovergine, N; Richter, V | Articolo su rivista | - |
20 | 2004 | Structural analysis by reflectance anisotropy spectroscopy: As and Sb on GaAs(110) | Pulci, O; Fleischer, K; Pristovsek, M;Tsukamoto, S; Del Sole, R; Richter, W | Articolo su rivista | - |