Sfoglia per Autore
Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity
1987-01-01 Selci, S; Cricenti, A; Ciccacci, F; Felici, A; Goletti, C; Yong, Z; Chiarotti, G
Polarization dependence of optical transitions in GaP(1 1 0) and GaAs(1 1 0) surfaces studied with surface differential reflectivity
1987-01-01 Selci, S; Ciccacci, F; Cricenti, A; Felici, A; Goletti, C; Chiaradia, P
Polarization-dependent surface transitions at Sb/GaAs (110)
1993-01-01 Chiaradia, P; Shkrebtii, A; Goletti, C; Wang, J; DEL SOLE, R
Schottky barrier at the Au/Gap(110) interface
1996-01-01 Fanfoni, M; Goletti, C; Chiaradia, P; Ng, W; Cerrina, F; Hwu, Y; Terrasi, A; Margaritondo, G
Activated chemisorption of oxygen on Si(111)-2x1
1996-01-01 Goletti, C; Chiaradia, P; Moretti, L; Yian, W; Chiarotti, G; Selci, S
A reflectance anisotropy spectroscopy study of GaSb(100)c(2x6) surfaces prepared by Sb decapping
1996-01-01 Goletti, C; Resch Esser, U; Foeller, J; Esser, N; Richter, W; Brar, B; Kroemer, H
Optical anisotropies of InP(001) surfaces
1997-01-01 Goletti, C; Esser, N; Resch Esser, U; Wagner, V; Foeller, J; Pristovsek, M; Richter, W
Surface reflectance anisotropy of indium-terminated GaAs(100) surfaces
1997-01-01 Springer, C; Resch Esser, U; Goletti, C; Richter, W; Fimland, B
Optical properties of bismuth-terminated GaAs(110) surfaces
1998-01-01 Chiaradia, P; Goletti, C; Jian, W
Characterization and design of porphyrins-based broad selectivity chemical sensors for electronic nose applications
1998-01-01 DI NATALE, C; Paolesse, R; Macagnano, A; Mantini, A; Goletti, C; D'Amico, A
Kelvin probe and scanning tunneling microscope characterization of Langmuir-Blodgett sapphyrin films
1999-01-01 Goletti, C; Sgarlata, A; Motta, N; Chiaradia, P; Paolesse, R; Angelaccio, A; Drago, M; DI NATALE, C; D'Amico, A; Cocco, M; Troitsky, V
Kelvin probe investigation of the thickness effects in Langmuir-Blodgett films of pyrrolic macrocycles sensitive to volatile compounds in gas phase
1999-01-01 DI NATALE, C; Goletti, C; Paolesse, R; Drago, M; Macagnano, A; Mantini, A; Troitsky, V; Berzina, T; Cocco, M; D'Amico, A
Ge/GaAs(001) interface formation investigated by reflectance anisotropy spectroscopy
1999-01-01 Emiliani, V; Shkrebtii, A; Goletti, C; Frisch, A; Fimland, B; Esser, N; Richter, W
Optical anisotropy of Langmuir-Blodgett sapphyrin films
2000-01-01 DI NATALE, C; Goletti, C; Paolesse, R; Della Sala, F; Drago, M; Chiaradia, P; Lugli, P; D'Amico, A
Chemical sensing materials characterization by Kelvin probe technique
2000-01-01 D'Amico, A; DI NATALE, C; Paolesse, R; Mantini, A; Goletti, C; Davide, F; Filosofi, G
Optical characterization of indium-terminated GaAs(001) surfaces
2000-01-01 Goletti, C; Springer, C; Resch Esser, U; Esser, N; Richter, W; Fimland, B
Optical Properties of Semiconductor Surfaces
2001-01-01 Chiarotti, G; Goletti, C; Chiaradia, P; Arciprete, F
Analysis of InAs(001) surfaces by reflectance anisotropy spectroscopy
2001-01-01 Goletti, C; Arciprete, F; Almaviva, S; Chiaradia, P; Esser, N; Richter, W
A reflectance anisotropy spectroscopy investigation of porphyrin langmuir-blodgett films
2001-01-01 Goletti, C; Bussetti, G; Chiaradia, P; Paolesse, R; DI NATALE, C; Mazzone, E; D'Amico, A
Infrared surface absorption in Si(111)2x1 observed with reflectance anisotropy spectroscopy
2002-01-01 Goletti, C; Bussetti, G; Arciprete, F; Chiaradia, P; Chiarotti, G
Data di pubblicazione | Titolo | Autore(i) | Tipo | File |
---|---|---|---|---|
1-gen-1987 | Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity | Selci, S; Cricenti, A; Ciccacci, F; Felici, A; Goletti, C; Yong, Z; Chiarotti, G | Articolo su rivista | |
1-gen-1987 | Polarization dependence of optical transitions in GaP(1 1 0) and GaAs(1 1 0) surfaces studied with surface differential reflectivity | Selci, S; Ciccacci, F; Cricenti, A; Felici, A; Goletti, C; Chiaradia, P | Articolo su rivista | |
1-gen-1993 | Polarization-dependent surface transitions at Sb/GaAs (110) | Chiaradia, P; Shkrebtii, A; Goletti, C; Wang, J; DEL SOLE, R | Articolo su rivista | |
1-gen-1996 | Schottky barrier at the Au/Gap(110) interface | Fanfoni, M; Goletti, C; Chiaradia, P; Ng, W; Cerrina, F; Hwu, Y; Terrasi, A; Margaritondo, G | Articolo su rivista | |
1-gen-1996 | Activated chemisorption of oxygen on Si(111)-2x1 | Goletti, C; Chiaradia, P; Moretti, L; Yian, W; Chiarotti, G; Selci, S | Articolo su rivista | |
1-gen-1996 | A reflectance anisotropy spectroscopy study of GaSb(100)c(2x6) surfaces prepared by Sb decapping | Goletti, C; Resch Esser, U; Foeller, J; Esser, N; Richter, W; Brar, B; Kroemer, H | Intervento a convegno | |
1-gen-1997 | Optical anisotropies of InP(001) surfaces | Goletti, C; Esser, N; Resch Esser, U; Wagner, V; Foeller, J; Pristovsek, M; Richter, W | Articolo su rivista | |
1-gen-1997 | Surface reflectance anisotropy of indium-terminated GaAs(100) surfaces | Springer, C; Resch Esser, U; Goletti, C; Richter, W; Fimland, B | Intervento a convegno | |
1-gen-1998 | Optical properties of bismuth-terminated GaAs(110) surfaces | Chiaradia, P; Goletti, C; Jian, W | Articolo su rivista | |
1-gen-1998 | Characterization and design of porphyrins-based broad selectivity chemical sensors for electronic nose applications | DI NATALE, C; Paolesse, R; Macagnano, A; Mantini, A; Goletti, C; D'Amico, A | Articolo su rivista | |
1-gen-1999 | Kelvin probe and scanning tunneling microscope characterization of Langmuir-Blodgett sapphyrin films | Goletti, C; Sgarlata, A; Motta, N; Chiaradia, P; Paolesse, R; Angelaccio, A; Drago, M; DI NATALE, C; D'Amico, A; Cocco, M; Troitsky, V | Articolo su rivista | |
1-gen-1999 | Kelvin probe investigation of the thickness effects in Langmuir-Blodgett films of pyrrolic macrocycles sensitive to volatile compounds in gas phase | DI NATALE, C; Goletti, C; Paolesse, R; Drago, M; Macagnano, A; Mantini, A; Troitsky, V; Berzina, T; Cocco, M; D'Amico, A | Intervento a convegno | |
1-gen-1999 | Ge/GaAs(001) interface formation investigated by reflectance anisotropy spectroscopy | Emiliani, V; Shkrebtii, A; Goletti, C; Frisch, A; Fimland, B; Esser, N; Richter, W | Articolo su rivista | |
1-gen-2000 | Optical anisotropy of Langmuir-Blodgett sapphyrin films | DI NATALE, C; Goletti, C; Paolesse, R; Della Sala, F; Drago, M; Chiaradia, P; Lugli, P; D'Amico, A | Articolo su rivista | |
1-gen-2000 | Chemical sensing materials characterization by Kelvin probe technique | D'Amico, A; DI NATALE, C; Paolesse, R; Mantini, A; Goletti, C; Davide, F; Filosofi, G | Articolo su rivista | |
1-gen-2000 | Optical characterization of indium-terminated GaAs(001) surfaces | Goletti, C; Springer, C; Resch Esser, U; Esser, N; Richter, W; Fimland, B | Articolo su rivista | |
1-gen-2001 | Optical Properties of Semiconductor Surfaces | Chiarotti, G; Goletti, C; Chiaradia, P; Arciprete, F | Contributo in libro | |
1-gen-2001 | Analysis of InAs(001) surfaces by reflectance anisotropy spectroscopy | Goletti, C; Arciprete, F; Almaviva, S; Chiaradia, P; Esser, N; Richter, W | Articolo su rivista | |
1-gen-2001 | A reflectance anisotropy spectroscopy investigation of porphyrin langmuir-blodgett films | Goletti, C; Bussetti, G; Chiaradia, P; Paolesse, R; DI NATALE, C; Mazzone, E; D'Amico, A | Articolo su rivista | |
1-gen-2002 | Infrared surface absorption in Si(111)2x1 observed with reflectance anisotropy spectroscopy | Goletti, C; Bussetti, G; Arciprete, F; Chiaradia, P; Chiarotti, G | Articolo su rivista |
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