Optical transitions between surface states associated with dangling bonds in Si(111)2X1 have been measured by means of reflection anisotropy spectroscopy in the near infrared. The results confirm those previously obtained with other optical techniques (namely surface differential reflectivity and photothermal deflection spectroscopies). The method does not require oxidation of the surface and thus opens the way to studying a number of problems in surface physics, including the temperature dependence of surface transitions in Si(111)2x1 and Ge(111)2x1.

Goletti, C., Bussetti, G., Arciprete, F., Chiaradia, P., & Chiarotti, G. (2002). Infrared surface absorption in Si(111)2x1 observed with reflectance anisotropy spectroscopy. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 66(15), 1533071-1533073.

Infrared surface absorption in Si(111)2x1 observed with reflectance anisotropy spectroscopy

GOLETTI, CLAUDIO;BUSSETTI, GIANLORENZO;ARCIPRETE, FABRIZIO;CHIAROTTI, GIANFRANCO
2002

Abstract

Optical transitions between surface states associated with dangling bonds in Si(111)2X1 have been measured by means of reflection anisotropy spectroscopy in the near infrared. The results confirm those previously obtained with other optical techniques (namely surface differential reflectivity and photothermal deflection spectroscopies). The method does not require oxidation of the surface and thus opens the way to studying a number of problems in surface physics, including the temperature dependence of surface transitions in Si(111)2x1 and Ge(111)2x1.
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - Fisica della Materia
English
Con Impact Factor ISI
silicon; anisotropy; article; electron diffraction; infrared radiation; optics; oxidation; reflectance anisotropy spectroscopy; semiconductor; spectroscopy; surface property; temperature
Goletti, C., Bussetti, G., Arciprete, F., Chiaradia, P., & Chiarotti, G. (2002). Infrared surface absorption in Si(111)2x1 observed with reflectance anisotropy spectroscopy. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 66(15), 1533071-1533073.
Goletti, C; Bussetti, G; Arciprete, F; Chiaradia, P; Chiarotti, G
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2108/43706
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