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We present a determination of surface dielectric functions (SDF) of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained using polarized surface differential reflectivity (SDR) technique. © 1987 Elsevier Science Publishers B.V. (North-Holland Physics Publishing Division).

Selci, S., Cricenti, A., Ciccacci, F., Felici, A., Goletti, C., Yong, Z., et al. (1987). Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity. SURFACE SCIENCE, 189-190(C), 1023-1027.

Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity

GOLETTI, CLAUDIO;
1987-01-01

Abstract

We present a determination of surface dielectric functions (SDF) of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained using polarized surface differential reflectivity (SDR) technique. © 1987 Elsevier Science Publishers B.V. (North-Holland Physics Publishing Division).
1987
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - FISICA DELLA MATERIA
English
Con Impact Factor ISI
Selci, S., Cricenti, A., Ciccacci, F., Felici, A., Goletti, C., Yong, Z., et al. (1987). Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity. SURFACE SCIENCE, 189-190(C), 1023-1027.
Selci, S; Cricenti, A; Ciccacci, F; Felici, A; Goletti, C; Yong, Z; Chiarotti, G
Articolo su rivista
01 - Articolo su rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/29585
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