DAVOLI, IVAN
DAVOLI, IVAN
Dipartimento di Fisica
Anodization-based process for the fabrication of all niobium nitride Josephson junction structures
2017-01-01 Lucci, M; Ottaviani, I; Cirillo, M; DE MATTEIS, F; Francini, R; Merlo, V; Davoli, I
Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films
2008-01-01 Passeri, D; Rossi, M; Alippi, A; Bettucci, A; Manno, D; Serra, A; Filippo, E; Lucci, M; Davoli, I
Atomic force microscopy techniques for nanomechanical characterization : a polymer case study
2015-01-01 Reggente, M; Rossi, M; Angeloni, L; Tamburri, E; Lucci, M; Davoli, I; TERRANOVA PERSICHELLI, Ml; Passeri, D
Biophotons and emergence of quantum coherence : a diffusion entropy analysis
2021-01-01 Benfatto, M; Pace, E; Curceanu, C; Scordo, A; Clozza, A; Davoli, I; Lucci, M; Francini, R; De Matteis, F; Grandi, M; Tuladhar, R; Grigolini, P
Biophotons: general aspects and new experimental data
2018-01-01 Benfatto, M; Davoli, I; Pace, E; Lucci, M; Francini, Fdmr; Grigolini, P; Curceanu, C; Pace, E; Bubacco, L; Grandi, M
Boosting highly transparent and conducting indium zinc oxide thin films through solution combustion synthesis: influence of rapid thermal annealing
2018-01-01 Ullah, S; Branquinho, R; Santa, A; Golçalves, G; Davoli, I; de Matteis, F; Martins, R; Fortunato, E
Characterization of CdS sputtering deposition on low temperature pulsed electron deposition Cu(In,Ga)Se2 solar cells
2020-03-01 Miliucci, M; Lucci, M; Colantoni, I; De Matteis, F; Micciulla, F; Clozza, A; Macis, S; Davoli, I
Characterization of Thick film of Copper Electrodeposited for Cryogenic Applications
2014-07-25 Fava, A; Lucci, M; Faso, D; Luzzi, A; Salvato, M; Vecchione, A; Fittipaldi, R; Ottaviani, I; Colantoni, I; Davoli, I; Tomellini, M
A combination of solution synthesis & solution combustion synthesis for highly conducting and transparent Aluminum Zinc Oxide thin films
2015-01-01 Ullaha, S; DE MATTEIS, F; Branquinho, R; Fortunato, E; Martins, R; Davoli, I
Discoloration of the smalt pigment:Experimental studies and ab initio calculations
2012-09-07 Cianchetta, I; Colantoni, I; Talarico, F; D'Acapito, F; Trapananti, A; Maurizio, C; Fantacci, S; Davoli, I
Electrical and mechanical characterization of coated conductors lap joints
2010-01-01 Celentano, G; Augieri, A; Mauretti, A; Vannozzi, A; Angrisani, A; Armenio, S; Galluzzi, A; Gaudio, A; Mancini, A; Rufoloni, A; Davoli, I; Del Gaudio, C; Nanni, F
Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction
2008-01-01 Lucci, M; Thanh, H; Davoli, I
Electron spectroscopy study in the NbN growth for NbN/AlN interfaces
2007-01-01 Lucci, M; Sanna, S; Contini, G; Zema, N; Merlo, V; Salvato, M; Thanh, H; Davoli, I
Electron spectroscopy study in the NbN growth for NbN/AlN interfaces
2007-01-01 Lucci, M; Sanna, S; Contini, G; Zema, N; Merlo, V; Salvato, M; Thanh, Hn; Davoli, I
Electronic characterization of single walled carbon nanotubes: a Xanes study
2005-01-01 Wu, Z; Davoli, I; TERRANOVA PERSICHELLI, Ml; Orlanducci, S; Sessa, V; Abbas, M; Ibrahim, K; Zhong, J; Botti, S
In situ space-resolved X-ray diffraction and time-resolved EDXD on efficient polymer-based photovoltaic devices: Microstructural properties and aging effects
2017-01-01 Silvestri, F; Generosi, A; Guaragno, M; Albertini, Vr; Ferrero, C; Susanna, G; Brunetti, F; Davoli, I; Paci, B
Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study
2009-01-01 Passeri, D; Bettucci, A; Biagioni, A; Rossi, M; Alippi, A; Tamburri, E; Lucci, M; Davoli, I; Berezina, S
Interface ordering in Sim/Gen monolayer superlattices: A photoluminescence study
1996-01-01 Casalboni, M; Pinto, N; Izzi, B; Davoli, I; DE CRESCENZI, M; DE MATTEIS, F; Prosposito, P; Pizzoferrato, R
Inx Ga(1-x)As quantum dots grown on GaAs studied by EXAFS in total reflection mode (ReflEXAFS)
2003-01-01 D'Acapito, F; Colonna, S; Arciprete, F; Balzarotti, A; Davoli, I; Patella, F; Mobilio, S
Mechanical characterization of stacked thin films: The cases of aluminum zinc oxide and indium zinc oxide grown by solution and combustion synthesis
2017-10-04 Ullah, S; Lucci, M; DE MATTEIS, F; Davoli, I
| Data di pubblicazione | Titolo | Autore(i) | Tipo | File |
|---|---|---|---|---|
| 1-gen-2017 | Anodization-based process for the fabrication of all niobium nitride Josephson junction structures | Lucci, M; Ottaviani, I; Cirillo, M; DE MATTEIS, F; Francini, R; Merlo, V; Davoli, I | Articolo su rivista | |
| 1-gen-2008 | Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films | Passeri, D; Rossi, M; Alippi, A; Bettucci, A; Manno, D; Serra, A; Filippo, E; Lucci, M; Davoli, I | Articolo su rivista | |
| 1-gen-2015 | Atomic force microscopy techniques for nanomechanical characterization : a polymer case study | Reggente, M; Rossi, M; Angeloni, L; Tamburri, E; Lucci, M; Davoli, I; TERRANOVA PERSICHELLI, Ml; Passeri, D | Articolo su rivista | |
| 1-gen-2021 | Biophotons and emergence of quantum coherence : a diffusion entropy analysis | Benfatto, M; Pace, E; Curceanu, C; Scordo, A; Clozza, A; Davoli, I; Lucci, M; Francini, R; De Matteis, F; Grandi, M; Tuladhar, R; Grigolini, P | Articolo su rivista | |
| 1-gen-2018 | Biophotons: general aspects and new experimental data | Benfatto, M; Davoli, I; Pace, E; Lucci, M; Francini, Fdmr; Grigolini, P; Curceanu, C; Pace, E; Bubacco, L; Grandi, M | Intervento a convegno | |
| 1-gen-2018 | Boosting highly transparent and conducting indium zinc oxide thin films through solution combustion synthesis: influence of rapid thermal annealing | Ullah, S; Branquinho, R; Santa, A; Golçalves, G; Davoli, I; de Matteis, F; Martins, R; Fortunato, E | Articolo su rivista | |
| 1-mar-2020 | Characterization of CdS sputtering deposition on low temperature pulsed electron deposition Cu(In,Ga)Se2 solar cells | Miliucci, M; Lucci, M; Colantoni, I; De Matteis, F; Micciulla, F; Clozza, A; Macis, S; Davoli, I | Articolo su rivista | |
| 25-lug-2014 | Characterization of Thick film of Copper Electrodeposited for Cryogenic Applications | Fava, A; Lucci, M; Faso, D; Luzzi, A; Salvato, M; Vecchione, A; Fittipaldi, R; Ottaviani, I; Colantoni, I; Davoli, I; Tomellini, M | Articolo su rivista | |
| 1-gen-2015 | A combination of solution synthesis & solution combustion synthesis for highly conducting and transparent Aluminum Zinc Oxide thin films | Ullaha, S; DE MATTEIS, F; Branquinho, R; Fortunato, E; Martins, R; Davoli, I | Intervento a convegno | |
| 7-set-2012 | Discoloration of the smalt pigment:Experimental studies and ab initio calculations | Cianchetta, I; Colantoni, I; Talarico, F; D'Acapito, F; Trapananti, A; Maurizio, C; Fantacci, S; Davoli, I | Articolo su rivista | |
| 1-gen-2010 | Electrical and mechanical characterization of coated conductors lap joints | Celentano, G; Augieri, A; Mauretti, A; Vannozzi, A; Angrisani, A; Armenio, S; Galluzzi, A; Gaudio, A; Mancini, A; Rufoloni, A; Davoli, I; Del Gaudio, C; Nanni, F | Articolo su rivista | |
| 1-gen-2008 | Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction | Lucci, M; Thanh, H; Davoli, I | Articolo su rivista | |
| 1-gen-2007 | Electron spectroscopy study in the NbN growth for NbN/AlN interfaces | Lucci, M; Sanna, S; Contini, G; Zema, N; Merlo, V; Salvato, M; Thanh, H; Davoli, I | Articolo su rivista | |
| 1-gen-2007 | Electron spectroscopy study in the NbN growth for NbN/AlN interfaces | Lucci, M; Sanna, S; Contini, G; Zema, N; Merlo, V; Salvato, M; Thanh, Hn; Davoli, I | Articolo su rivista | |
| 1-gen-2005 | Electronic characterization of single walled carbon nanotubes: a Xanes study | Wu, Z; Davoli, I; TERRANOVA PERSICHELLI, Ml; Orlanducci, S; Sessa, V; Abbas, M; Ibrahim, K; Zhong, J; Botti, S | Articolo su rivista | |
| 1-gen-2017 | In situ space-resolved X-ray diffraction and time-resolved EDXD on efficient polymer-based photovoltaic devices: Microstructural properties and aging effects | Silvestri, F; Generosi, A; Guaragno, M; Albertini, Vr; Ferrero, C; Susanna, G; Brunetti, F; Davoli, I; Paci, B | Articolo su rivista | |
| 1-gen-2009 | Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study | Passeri, D; Bettucci, A; Biagioni, A; Rossi, M; Alippi, A; Tamburri, E; Lucci, M; Davoli, I; Berezina, S | Articolo su rivista | |
| 1-gen-1996 | Interface ordering in Sim/Gen monolayer superlattices: A photoluminescence study | Casalboni, M; Pinto, N; Izzi, B; Davoli, I; DE CRESCENZI, M; DE MATTEIS, F; Prosposito, P; Pizzoferrato, R | Articolo su rivista | |
| 1-gen-2003 | Inx Ga(1-x)As quantum dots grown on GaAs studied by EXAFS in total reflection mode (ReflEXAFS) | D'Acapito, F; Colonna, S; Arciprete, F; Balzarotti, A; Davoli, I; Patella, F; Mobilio, S | Intervento a convegno | |
| 4-ott-2017 | Mechanical characterization of stacked thin films: The cases of aluminum zinc oxide and indium zinc oxide grown by solution and combustion synthesis | Ullah, S; Lucci, M; DE MATTEIS, F; Davoli, I | Articolo su rivista |