Atomic force microscopy techniques for nanomechanical characterization : a polymer case study

Atomic force microscopy (AFM) is a versatile tool to perform mechanical characterization of surface samples at the nanoscale. In this work, we review two of such methods, namely contact resonance AFM (CR-AFM) and torsional harmonics AFM (TH-AFM). First, such techniques are illustrated and their applicability on materials with elastic moduli in different ranges are discussed, together with their main advantages and limitations. Then, a case study is presented in which we report the mechanical characterization using both CR-AFM and TH-AFM of polyaniline and polyaniniline doped with nanodiamond particles tablets prepared by a pressing process. We determined the indentation modulus values of their surfaces, which were found in fairly good agreement, thus demonstrating the accuracy of the techniques. Finally, the determined surface elastic moduli have been compared with the bulk ones measured through standard indentation testing. INTRODUCTION In the field of nanotechnology, the development of innovative and nondestructive characterization techniques plays a crucial role. Indeed, the characterization of nanostructured hybrid materials (e.g., thin films and nanocomposites) and devices requires the capability of acquiring maps of the local mechanical properties at the nanoscale. Nanoindentation is the most common method for determining the mechanical properties of thin films. However, its applicability is strictly limited by the thickness of the sample. Furthermore, its poor spatial resolution does not allow the reconstruction of an accurate distribution of the sample surface mechanical properties. For this reason, alternative methods, based on atomic force microscopy (AFM), have been developed. By exploiting the high resolution of the AFM, maps of the surface mechanical properties (i.e., indentation modulus) can be achieved. Among these techniques, AFM nanoindentation1 is the simplest method used to evaluate the local mechanical properties of