Nanostructured tin selenide based ultrathin films have been deposited on fused quartz substrates by thermal evaporation. The morphological and structural properties of the obtained polycrystalline SnSe films have been routinely characterized using atomic force microscopy (AFM), high-resolution transmission electron microscopy (HRTEM), and small-area electron diffraction (SAED). The atomic force acoustic microscopy (AFAM) technique has been used in order to perform a preliminary characterization of the local elastic properties of a film surface. The reported results represent our first attempt to explore the capability of the AFAM technique to discriminate between different phases in such nanostructured compounds.

Passeri, D., Rossi, M., Alippi, A., Bettucci, A., Manno, D., Serra, A., et al. (2008). Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films. SUPERLATTICES AND MICROSTRUCTURES, 44(4-5), 641-649 [10.1016/j.spmi.2007.10.004].

Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films

LUCCI, MASSIMILIANO;DAVOLI, IVAN
2008-01-01

Abstract

Nanostructured tin selenide based ultrathin films have been deposited on fused quartz substrates by thermal evaporation. The morphological and structural properties of the obtained polycrystalline SnSe films have been routinely characterized using atomic force microscopy (AFM), high-resolution transmission electron microscopy (HRTEM), and small-area electron diffraction (SAED). The atomic force acoustic microscopy (AFAM) technique has been used in order to perform a preliminary characterization of the local elastic properties of a film surface. The reported results represent our first attempt to explore the capability of the AFAM technique to discriminate between different phases in such nanostructured compounds.
2008
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - FISICA DELLA MATERIA
English
Con Impact Factor ISI
Atomic force acoustic microscopy; Indentation modulus measurement; Elastic properties imaging
http://www.sciencedirect.com/science/article/pii/S0749603607002741
Passeri, D., Rossi, M., Alippi, A., Bettucci, A., Manno, D., Serra, A., et al. (2008). Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films. SUPERLATTICES AND MICROSTRUCTURES, 44(4-5), 641-649 [10.1016/j.spmi.2007.10.004].
Passeri, D; Rossi, M; Alippi, A; Bettucci, A; Manno, D; Serra, A; Filippo, E; Lucci, M; Davoli, I
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/59859
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