Alternate Si and Ge monolayers deposited by molecular-beam epitaxy on Si0.7Ge0.3 alloy have been analyzed by means of photoluminescence spectroscopy. We measured well-resolved excitonic transitions located at 0.8 eV, far from the alloy emission with the same stoichiometric composition. We discuss this feature in terms of interface mixing producing an ordered alloy to accommodate the tetragonal strain in the Sim/Gen monolayer superlattice with m and n < 3.

Casalboni, M., Pinto, N., Izzi, B., Davoli, I., DE CRESCENZI, M., DE MATTEIS, F., et al. (1996). Interface ordering in Sim/Gen monolayer superlattices: A photoluminescence study. PHYSICAL REVIEW. B, CONDENSED MATTER, 53(3), 1030-1033.

Interface ordering in Sim/Gen monolayer superlattices: A photoluminescence study

CASALBONI, MAURO;DAVOLI, IVAN;DE CRESCENZI, MAURIZIO;DE MATTEIS, FABIO;PROSPOSITO, PAOLO;PIZZOFERRATO, ROBERTO
1996

Abstract

Alternate Si and Ge monolayers deposited by molecular-beam epitaxy on Si0.7Ge0.3 alloy have been analyzed by means of photoluminescence spectroscopy. We measured well-resolved excitonic transitions located at 0.8 eV, far from the alloy emission with the same stoichiometric composition. We discuss this feature in terms of interface mixing producing an ordered alloy to accommodate the tetragonal strain in the Sim/Gen monolayer superlattice with m and n < 3.
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03 - Fisica della Materia
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
Settore FIS/01 - Fisica Sperimentale
English
Condensed Matter Physics
Casalboni, M., Pinto, N., Izzi, B., Davoli, I., DE CRESCENZI, M., DE MATTEIS, F., et al. (1996). Interface ordering in Sim/Gen monolayer superlattices: A photoluminescence study. PHYSICAL REVIEW. B, CONDENSED MATTER, 53(3), 1030-1033.
Casalboni, M; Pinto, N; Izzi, B; Davoli, I; DE CRESCENZI, M; DE MATTEIS, F; Prosposito, P; Pizzoferrato, R
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/130785
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