We review the structural results obtained by the analysis of the fine structure detected in the low kinetic energy range (50-400 eV) of the secondary electrons backscattered from solid surfaces. Several experiments have been performed to assess a unified picture of the physical mechanism underlying this fine structure. An interference effect experienced by the autoionized core electron seems to be the dominant channel in several materials. This allows a fruitful extension of the Auger technique to the short range structural analysis in terms of a straightforward determination of pair distribution function, disorder and thermal effects of the first few atomic layers.
DE CRESCENZI, M., Colonna, S., Gunnella, R., Fanfoni, M. (1996). Extended fine-structure in secondary backscattered electrons. In Progress in Surface Science (pp.253-264). OXFORD : PERGAMON-ELSEVIER SCIENCE LTD.
Extended fine-structure in secondary backscattered electrons
DE CRESCENZI, MAURIZIO;FANFONI, MASSIMO
1996-01-01
Abstract
We review the structural results obtained by the analysis of the fine structure detected in the low kinetic energy range (50-400 eV) of the secondary electrons backscattered from solid surfaces. Several experiments have been performed to assess a unified picture of the physical mechanism underlying this fine structure. An interference effect experienced by the autoionized core electron seems to be the dominant channel in several materials. This allows a fruitful extension of the Auger technique to the short range structural analysis in terms of a straightforward determination of pair distribution function, disorder and thermal effects of the first few atomic layers.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
