A model is presented for describing the time dependence of the photoelectron and/or Auger signals during the overlayer formation in the case of Volmer Weber growth mode, i.e. 3D island formation. The impingement among clusters has been taken into account in the framework of Avrami's statistical approach. A first system has been considered in which nucleation occurs at a given number of preexisting sites randomly distributed throughout the whole surface. The results obtained by numerical computations indicate that particular conditions can be indeed realized for which the PES signal is chiefly related to the kinetics of the surface fraction that is covered by islands. A more involved system has been also modeled where nucleation does not occur at preexisting sites but through the formation of stable dimers. Under this circumstance, Avrami's treatment of island impingement can be still retained although now a system of integral differential equations has to be solved to get the kinetics. Such a modelling should be suitable for describing the metallic film growth studied by PES.
Fanfoni, M., & Tomellini, M. (1995). Avrami's kinetic approach for describing Volmer Weber growth mode at solid surfaces studied via PES and AES. In Journal of Electron Spectroscopy and Related Phenomena (pp.283-288). AMSTERDAM : ELSEVIER SCIENCE BV.
|Autori:||Fanfoni, M; Tomellini, M|
|Titolo:||Avrami's kinetic approach for describing Volmer Weber growth mode at solid surfaces studied via PES and AES|
|Nome del convegno:||6th International Conference on Electron Spectroscopy (ICES 6)|
|Luogo del convegno:||ROME, ITALY|
|Anno del convegno:||JUN 19-23, 1995|
|Enti collegati al convegno:||Univ La Sapienza, Univ Tor Vergata, Univ Rome III, CNR, Gruppo Nazionale Struttura Materia|
|Data di pubblicazione:||1995|
|Settore Scientifico Disciplinare:||Settore FIS/03 - Fisica della Materia|
|Tipologia:||Intervento a convegno|
|Citazione:||Fanfoni, M., & Tomellini, M. (1995). Avrami's kinetic approach for describing Volmer Weber growth mode at solid surfaces studied via PES and AES. In Journal of Electron Spectroscopy and Related Phenomena (pp.283-288). AMSTERDAM : ELSEVIER SCIENCE BV.|
|Appare nelle tipologie:||02 - Intervento a convegno|