The thermal conductivity of Ge2Sb2Te5 GST layers, as well as the thermal boundary resistance at the interface between the GST and amorphous SiO2, was measured using a photothermal radiometry experiment. The two phase changes in the Ge2Sb2Te5 were retrieved, starting from the amorphous and sweeping to the face centered cubic fcc crystalline state at 130 °C and then to the hexagonal crystalline phase hcp at 310 °C. The thermal conductivity resulted to be constant in the amorphous phase, whereas it evolved between the two crystalline states. The thermal boundary resistance at the GST-SiO2 interface was estimated to be higher for the hcp phase than for the amorphous and fcc ones.
Battaglia, J.-., Kusiak, A., Schick, V., Cappella, A., Wiemer, C., Longo, M., et al. (2010). Thermal characterization of the SiO2 -Ge2Sb2Te5 interface from room temperature up to 400 °C. JOURNAL OF APPLIED PHYSICS, 107(4) [10.1063/1.3284084].
Thermal characterization of the SiO2 -Ge2Sb2Te5 interface from room temperature up to 400 °C
Longo, M.;
2010-01-01
Abstract
The thermal conductivity of Ge2Sb2Te5 GST layers, as well as the thermal boundary resistance at the interface between the GST and amorphous SiO2, was measured using a photothermal radiometry experiment. The two phase changes in the Ge2Sb2Te5 were retrieved, starting from the amorphous and sweeping to the face centered cubic fcc crystalline state at 130 °C and then to the hexagonal crystalline phase hcp at 310 °C. The thermal conductivity resulted to be constant in the amorphous phase, whereas it evolved between the two crystalline states. The thermal boundary resistance at the GST-SiO2 interface was estimated to be higher for the hcp phase than for the amorphous and fcc ones.File | Dimensione | Formato | |
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