In this paper a novel approach for determining device noise parameters over frequency is presented. Such methodology is made of two parts: the first one allows to straightforwardly extract single-frequency noise parameters from source-pull data; the second one extends this capability to multi-frequency, source-pull data to obtain a full description of device noise behavior over frequency by means of at most ten constant parameters (depending on the required accuracy). The whole process is automated via a software routine and does not need a previous knowledge of the active device equivalent circuit. © 2012 European Microwave Assoc.

Colangeli, S., Ciccognani, W., Palomba, M., Limiti, E. (2012). Automated Determination of Device Noise Parameters Using Multi-Frequency, Source- Pull Data. In Microwave Integrated Circuits Conference (EuMIC), 2012 7th European (pp.163-166). IEEE.

Automated Determination of Device Noise Parameters Using Multi-Frequency, Source- Pull Data

COLANGELI, SERGIO;CICCOGNANI, WALTER;LIMITI, ERNESTO
2012-01-01

Abstract

In this paper a novel approach for determining device noise parameters over frequency is presented. Such methodology is made of two parts: the first one allows to straightforwardly extract single-frequency noise parameters from source-pull data; the second one extends this capability to multi-frequency, source-pull data to obtain a full description of device noise behavior over frequency by means of at most ten constant parameters (depending on the required accuracy). The whole process is automated via a software routine and does not need a previous knowledge of the active device equivalent circuit. © 2012 European Microwave Assoc.
European Microwave Integrated Circuits Conference
Amsterdam RAI, The Netherlands
2012
7th
Rilevanza internazionale
contributo
Settore ING-INF/01 - Elettronica
English
Active devices; Constant parameters; Device noise; Multi frequency; Noise parameters; Single-frequency; Source-pull; Whole process Engineering main heading: Microwave integrated circuits
Intervento a convegno
Colangeli, S., Ciccognani, W., Palomba, M., Limiti, E. (2012). Automated Determination of Device Noise Parameters Using Multi-Frequency, Source- Pull Data. In Microwave Integrated Circuits Conference (EuMIC), 2012 7th European (pp.163-166). IEEE.
Colangeli, S; Ciccognani, W; Palomba, M; Limiti, E
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/92615
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