In this paper a novel approach for determining device noise parameters over frequency is presented. Such methodology is made of two parts: the first one allows to straightforwardly extract single-frequency noise parameters from source-pull data; the second one extends this capability to multi-frequency, source-pull data to obtain a full description of device noise behavior over frequency by means of at most ten constant parameters (depending on the required accuracy). The whole process is automated via a software routine and does not need a previous knowledge of the active device equivalent circuit. © 2012 European Microwave Assoc.
Colangeli, S., Ciccognani, W., Palomba, M., Limiti, E. (2012). Automated Determination of Device Noise Parameters Using Multi-Frequency, Source- Pull Data. In Microwave Integrated Circuits Conference (EuMIC), 2012 7th European (pp.163-166). IEEE.
Automated Determination of Device Noise Parameters Using Multi-Frequency, Source- Pull Data
COLANGELI, SERGIO;CICCOGNANI, WALTER;LIMITI, ERNESTO
2012-01-01
Abstract
In this paper a novel approach for determining device noise parameters over frequency is presented. Such methodology is made of two parts: the first one allows to straightforwardly extract single-frequency noise parameters from source-pull data; the second one extends this capability to multi-frequency, source-pull data to obtain a full description of device noise behavior over frequency by means of at most ten constant parameters (depending on the required accuracy). The whole process is automated via a software routine and does not need a previous knowledge of the active device equivalent circuit. © 2012 European Microwave Assoc.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
