Cleriti, R., Colangeli, S., Ciccognani, W., Limiti, E. (2013). Enhancing the cooling capabilities of a cryogenic probe station for on-wafer calibration and measurement at high frequency. In Proceedings of GE 2013: 45th Conference (Udine, 17-21 june 2013) (pp.55-56). DIEGM.

Enhancing the cooling capabilities of a cryogenic probe station for on-wafer calibration and measurement at high frequency

COLANGELI, SERGIO;CICCOGNANI, WALTER;LIMITI, ERNESTO
2013-01-01

GE Conference
Udine, Italy
2013
45.
Rilevanza nazionale
contributo
2013
Settore ING-INF/01 - ELETTRONICA
English
Intervento a convegno
Cleriti, R., Colangeli, S., Ciccognani, W., Limiti, E. (2013). Enhancing the cooling capabilities of a cryogenic probe station for on-wafer calibration and measurement at high frequency. In Proceedings of GE 2013: 45th Conference (Udine, 17-21 june 2013) (pp.55-56). DIEGM.
Cleriti, R; Colangeli, S; Ciccognani, W; Limiti, E
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/89878
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