A lumped equivalent circuit is proposed which can characterize both the interacting and the noninteracting cascaded step discontinuities in microstrip lines. The model is based on a dynamic approach, utilizes practically frequency-independent lumped elements, is very broadband, and is easy to implement in presently available commercial packages. This approach makes it possible to overcome the geometrical/frequency limitations or poor accuracy of presently available models. Experiments confirm the effectiveness of the proposed approach and suggest its usefulness in the design of microwave and millimeter-wave monolithic ICs Index Terms

Giannini, F., Bartolucci, G., Ruggieri, M. (1989). Enhanced model for interacting step-discontinuities. In IEEE 1989 MTT-S International Microwave Symposium Digest (pp.251-254). IEEE [10.1109/MWSYM.1989.38712].

Enhanced model for interacting step-discontinuities

GIANNINI, FRANCO;BARTOLUCCI, GIANCARLO;RUGGIERI, MARINA
1989-06-01

Abstract

A lumped equivalent circuit is proposed which can characterize both the interacting and the noninteracting cascaded step discontinuities in microstrip lines. The model is based on a dynamic approach, utilizes practically frequency-independent lumped elements, is very broadband, and is easy to implement in presently available commercial packages. This approach makes it possible to overcome the geometrical/frequency limitations or poor accuracy of presently available models. Experiments confirm the effectiveness of the proposed approach and suggest its usefulness in the design of microwave and millimeter-wave monolithic ICs Index Terms
IEEE 1989 MTT-S International Microwave Symposium
Long Beach, CA (USA)
1989
IEEE
Rilevanza internazionale
contributo
giu-1989
giu-1989
Settore ING-INF/01 - ELETTRONICA
English
step-discontinuities, lumped model
INSPEC Accession Number: 3484167
Intervento a convegno
Giannini, F., Bartolucci, G., Ruggieri, M. (1989). Enhanced model for interacting step-discontinuities. In IEEE 1989 MTT-S International Microwave Symposium Digest (pp.251-254). IEEE [10.1109/MWSYM.1989.38712].
Giannini, F; Bartolucci, G; Ruggieri, M
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/65930
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