An atomic force microscopy (AFM) based technique is proposed for the characterization of both indentation modulus and hardness of compliant materials. A standard AFM tip is used as an indenter to record force versus indentation curves analogous to those obtained in standard indentation tests. In order to overcome the lack of information about the apex geometry, the proposed technique requires calibration using a set of reference samples whose mechanical properties have been previously characterized by means of an independent technique, such as standard indentation. Due to the selected reference samples, the technique has been demonstrated to allow reliable measurements of indentation modulus and hardness in the range of 0.3–4.0 GPa and 15–250 MPa, respectively.
Passeri, D., Bettucci, A., Biagioni, A., Rossi, M., Alippi, A., Lucci, M., et al. (2008). Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy. REVIEW OF SCIENTIFIC INSTRUMENTS, 79(6), 066105 [10.1063/1.2949387].
Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy
LUCCI, MASSIMILIANO;DAVOLI, IVAN;
2008-01-01
Abstract
An atomic force microscopy (AFM) based technique is proposed for the characterization of both indentation modulus and hardness of compliant materials. A standard AFM tip is used as an indenter to record force versus indentation curves analogous to those obtained in standard indentation tests. In order to overcome the lack of information about the apex geometry, the proposed technique requires calibration using a set of reference samples whose mechanical properties have been previously characterized by means of an independent technique, such as standard indentation. Due to the selected reference samples, the technique has been demonstrated to allow reliable measurements of indentation modulus and hardness in the range of 0.3–4.0 GPa and 15–250 MPa, respectively.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
