The reversible phase transition of the Si(111):In-(4x1) surface has been studied using Raman spectroscopy and the symmetry, frequencies, and linewidths of the surface phonon modes have been determined. Dramatically different behavior has been identified for vibrational motion in the direction of the In chains and orthogonal to them. The differences in the Raman spectra of the room and low temperature surface are discussed in terms of the Peierls transition model and a recent dynamical soft shear distortion model. The measurements are found to be consistent with the former model, while some difficulties arise for the latter model. A combined Peierls transition and soft shear distortion model is consistent with the data, but is lacking detail. The Raman spectra presented here represent a challenge in developing theoretical models of this complex system.

Fleischer, K., Chandola, S., Esser, N., Richter, W., Mcgilp, J. (2007). Surface phonons of the Si(111): In-(4x1) and (8x2) phases. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 76(20) [10.1103/PhysRevB.76.205406].

Surface phonons of the Si(111): In-(4x1) and (8x2) phases

RICHTER, WOLFGANG;
2007-01-01

Abstract

The reversible phase transition of the Si(111):In-(4x1) surface has been studied using Raman spectroscopy and the symmetry, frequencies, and linewidths of the surface phonon modes have been determined. Dramatically different behavior has been identified for vibrational motion in the direction of the In chains and orthogonal to them. The differences in the Raman spectra of the room and low temperature surface are discussed in terms of the Peierls transition model and a recent dynamical soft shear distortion model. The measurements are found to be consistent with the former model, while some difficulties arise for the latter model. A combined Peierls transition and soft shear distortion model is consistent with the data, but is lacking detail. The Raman spectra presented here represent a challenge in developing theoretical models of this complex system.
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - Fisica della Materia
English
METAL-INSULATOR-TRANSITION; RAMAN-SCATTERING; QUANTUM CHAINS; SILICON; FLUCTUATIONS; INSTABILITY; SI(111); SPIN
Fleischer, K., Chandola, S., Esser, N., Richter, W., Mcgilp, J. (2007). Surface phonons of the Si(111): In-(4x1) and (8x2) phases. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 76(20) [10.1103/PhysRevB.76.205406].
Fleischer, K; Chandola, S; Esser, N; Richter, W; Mcgilp, J
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/57547
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