During melting of Indium the structure of solid and liquid phases have been investigated by X-ray diffractometry (XRD) in 1-g conditions, At the melting point T-M a re-orientation of crystalline grains occurs in the solid phase. The texture change, unusually rapid for a thermally activated process, is attributed to an abnormal increase of vacancy concentration, This explanation is in agreement with the observed shifts of XRD peaks towards lower angles. As a consequence of the texture change,the lattice planes facing the first formed liquid are(002) and (101) planes, i.e. those planes allocating 1st and 2nd neighbours around a given atom with shell radii very close to the mean distance of nearest neighbours in liquid as obtained from the radial distribution function (RDF). Convective motions in the liquid can be eliminated by repeating the same XRD measurements in mu-g. To get the best experimental conditions it is discussed the possibility, to use thin oxide films grown on the external surface of samples as containers during melting. This technique was already successfully tested by present investigators in the experiment ES 311 A-B carried Out during the mission SPACELAB-1. (C) 2002 COSPAR. Published by Elsevier Science Ltd. All rights reserved.

Gondi, P., Montanari, R., Costanza, G. (2002). X-ray characterization of indium during melting. ??????? it.cilea.surplus.oa.citation.tipologie.CitationProceedings.prensentedAt ??????? G0 1 Symposium of COSPAR Scientific Commission G held at the 33rd COSPAR Scientific Assembly, Warsaw (POLAND) [10.1016/S0273-1177(01)00650-0].

X-ray characterization of indium during melting

MONTANARI, ROBERTO;COSTANZA, GIROLAMO
2002-01-01

Abstract

During melting of Indium the structure of solid and liquid phases have been investigated by X-ray diffractometry (XRD) in 1-g conditions, At the melting point T-M a re-orientation of crystalline grains occurs in the solid phase. The texture change, unusually rapid for a thermally activated process, is attributed to an abnormal increase of vacancy concentration, This explanation is in agreement with the observed shifts of XRD peaks towards lower angles. As a consequence of the texture change,the lattice planes facing the first formed liquid are(002) and (101) planes, i.e. those planes allocating 1st and 2nd neighbours around a given atom with shell radii very close to the mean distance of nearest neighbours in liquid as obtained from the radial distribution function (RDF). Convective motions in the liquid can be eliminated by repeating the same XRD measurements in mu-g. To get the best experimental conditions it is discussed the possibility, to use thin oxide films grown on the external surface of samples as containers during melting. This technique was already successfully tested by present investigators in the experiment ES 311 A-B carried Out during the mission SPACELAB-1. (C) 2002 COSPAR. Published by Elsevier Science Ltd. All rights reserved.
G0 1 Symposium of COSPAR Scientific Commission G held at the 33rd COSPAR Scientific Assembly
Warsaw (POLAND)
2000
Comm Space Res
Rilevanza internazionale
su invito
Settore ING-IND/21 - Metallurgia
English
Crystal lattices; Melting; Textures; Thin films; X ray diffraction analysis; Lattice planes; Indium; indium
Intervento a convegno
Gondi, P., Montanari, R., Costanza, G. (2002). X-ray characterization of indium during melting. ??????? it.cilea.surplus.oa.citation.tipologie.CitationProceedings.prensentedAt ??????? G0 1 Symposium of COSPAR Scientific Commission G held at the 33rd COSPAR Scientific Assembly, Warsaw (POLAND) [10.1016/S0273-1177(01)00650-0].
Gondi, P; Montanari, R; Costanza, G
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/51740
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