In CMOS smart sensors and microsystems it can be very convenient to integrate both analog and digital circuits in the same chip; since the supply voltage for high-accuracy, high-precision interfaces should be as immune from disturbances as possible, low drop out regulators are often necessary. Here we show a CMOS, dual op amp, fast, low drop out regulator which allows to diminish the power supply gain by orders of magnitude up to very high frequencies.

Falconi, C., D'Amico, A., Scotti, G., Trifiletti, A. (2008). Dual op amp, LDO regulator with power supply gain suppression for CMOS smart sensors and microsystems. In PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10 (pp.2470-2473). NEW YORK : IEEE [10.1109/ISCAS.2008.4541956].

Dual op amp, LDO regulator with power supply gain suppression for CMOS smart sensors and microsystems

FALCONI, CHRISTIAN;
2008

Abstract

In CMOS smart sensors and microsystems it can be very convenient to integrate both analog and digital circuits in the same chip; since the supply voltage for high-accuracy, high-precision interfaces should be as immune from disturbances as possible, low drop out regulators are often necessary. Here we show a CMOS, dual op amp, fast, low drop out regulator which allows to diminish the power supply gain by orders of magnitude up to very high frequencies.
2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Seattle, WA
MAY 18-21, 2008
IEEE
Rilevanza internazionale
Settore ING-INF/01 - Elettronica
English
Digital integrated circuits; Drops; Electric power distribution; Electric power transmission networks; Electric power utilization; Fluid mechanics; Local area networks; Microsystems; Sensors; Smart sensors; Technical presentations; International symposium; Low drop out regulators; Power supply gain; Digital circuits
Intervento a convegno
Falconi, C., D'Amico, A., Scotti, G., Trifiletti, A. (2008). Dual op amp, LDO regulator with power supply gain suppression for CMOS smart sensors and microsystems. In PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10 (pp.2470-2473). NEW YORK : IEEE [10.1109/ISCAS.2008.4541956].
Falconi, C; D'Amico, A; Scotti, G; Trifiletti, A
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/49627
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