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Bohmer, K., Forlin, B., Cazzaniga, C., Rech, P., Furano, G., Alachiotis, N., et al. (2023). Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs. In 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). New York : IEEE [10.1109/DFT59622.2023.10313556].

Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs

Ottavi, M.
2023-01-01
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Juan-Les-Pins, France
2023
Rilevanza internazionale
2023
Settore IINF-01/A - Elettronica
English
Intervento a convegno
Bohmer, K., Forlin, B., Cazzaniga, C., Rech, P., Furano, G., Alachiotis, N., et al. (2023). Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs. In 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). New York : IEEE [10.1109/DFT59622.2023.10313556].
Bohmer, K; Forlin, B; Cazzaniga, C; Rech, P; Furano, G; Alachiotis, N; Ottavi, M
02 - Intervento a convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/463832
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