The structure of Cu thin layers deposited on the MgO(0 0 1) surface obtained by cleavage in ultra high vacuum has been investigated by in situ X-ray absorption measurements as a function of the metal coverage. By exploiting the polarized nature of the synchrotron radiation it has been possible to measure the Cu-Cu bond length parallel to the substrate surface for coverages in the monolayer range. Extended X-ray absorption fine structure measurements have evidenced a Cu-Cu distance close to that of the bulk metal, resulting from a weak film-substrate interaction irrespective of the copper thickness. Copper oxidation on the MgO surface has not been evidenced. Our results give a direct confirmation that Cu grows in form of clusters and that the film-substrate interaction is weak as previously reported. © 2002 Published by Elsevier Science B.V.

Colonna, S., Arciprete, F., Balzarotti, A., Fanfoni, M., De Crescenzi, M., & Mobilio, S. (2002). In situ X-ray absorption measurements of the Cu/MgO(0 0 1) interface. SURFACE SCIENCE, 512 [10.1016/S0039-6028(02)01493-0].

In situ X-ray absorption measurements of the Cu/MgO(0 0 1) interface

ARCIPRETE, FABRIZIO;BALZAROTTI, ADALBERTO;FANFONI, MASSIMO;
2002

Abstract

The structure of Cu thin layers deposited on the MgO(0 0 1) surface obtained by cleavage in ultra high vacuum has been investigated by in situ X-ray absorption measurements as a function of the metal coverage. By exploiting the polarized nature of the synchrotron radiation it has been possible to measure the Cu-Cu bond length parallel to the substrate surface for coverages in the monolayer range. Extended X-ray absorption fine structure measurements have evidenced a Cu-Cu distance close to that of the bulk metal, resulting from a weak film-substrate interaction irrespective of the copper thickness. Copper oxidation on the MgO surface has not been evidenced. Our results give a direct confirmation that Cu grows in form of clusters and that the film-substrate interaction is weak as previously reported. © 2002 Published by Elsevier Science B.V.
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - Fisica della Materia
English
Con Impact Factor ISI
Catalysis; Clusters; Copper; Extended X-ray absorption fine structure (EXAFS); Growth; Magnesium oxides; X-ray absorption spectroscopy
Colonna, S., Arciprete, F., Balzarotti, A., Fanfoni, M., De Crescenzi, M., & Mobilio, S. (2002). In situ X-ray absorption measurements of the Cu/MgO(0 0 1) interface. SURFACE SCIENCE, 512 [10.1016/S0039-6028(02)01493-0].
Colonna, S; Arciprete, F; Balzarotti, A; Fanfoni, M; De Crescenzi, M; Mobilio, S
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2108/44949
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