The structure of Cu thin layers deposited on the MgO(0 0 1) surface obtained by cleavage in ultra high vacuum has been investigated by in situ X-ray absorption measurements as a function of the metal coverage. By exploiting the polarized nature of the synchrotron radiation it has been possible to measure the Cu-Cu bond length parallel to the substrate surface for coverages in the monolayer range. Extended X-ray absorption fine structure measurements have evidenced a Cu-Cu distance close to that of the bulk metal, resulting from a weak film-substrate interaction irrespective of the copper thickness. Copper oxidation on the MgO surface has not been evidenced. Our results give a direct confirmation that Cu grows in form of clusters and that the film-substrate interaction is weak as previously reported. © 2002 Published by Elsevier Science B.V.
Colonna, S., Arciprete, F., Balzarotti, A., Fanfoni, M., De Crescenzi, M., Mobilio, S. (2002). In situ X-ray absorption measurements of the Cu/MgO(0 0 1) interface. SURFACE SCIENCE, 512 [10.1016/S0039-6028(02)01493-0].
In situ X-ray absorption measurements of the Cu/MgO(0 0 1) interface
ARCIPRETE, FABRIZIO;BALZAROTTI, ADALBERTO;FANFONI, MASSIMO;
2002-01-01
Abstract
The structure of Cu thin layers deposited on the MgO(0 0 1) surface obtained by cleavage in ultra high vacuum has been investigated by in situ X-ray absorption measurements as a function of the metal coverage. By exploiting the polarized nature of the synchrotron radiation it has been possible to measure the Cu-Cu bond length parallel to the substrate surface for coverages in the monolayer range. Extended X-ray absorption fine structure measurements have evidenced a Cu-Cu distance close to that of the bulk metal, resulting from a weak film-substrate interaction irrespective of the copper thickness. Copper oxidation on the MgO surface has not been evidenced. Our results give a direct confirmation that Cu grows in form of clusters and that the film-substrate interaction is weak as previously reported. © 2002 Published by Elsevier Science B.V.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
