Gugliandolo, G., Crupi, G., Vadalà, V., Giofre, R., Raffo, A., Donato, N. (2025). A straightforward fitting strategy based on the complex Lorentzian function to fully and systematically characterize the kink effect in the output reflection coefficient of the GaN HEMT technology. In 2025 IEEE 12th International Workshop on Metrology for AeroSpace (MetroAeroSpace) (pp.706-710). New York : IEEE [10.1109/metroaerospace64938.2025.11114695].
A straightforward fitting strategy based on the complex Lorentzian function to fully and systematically characterize the kink effect in the output reflection coefficient of the GaN HEMT technology
Giofre, Rocco;
2025-01-01
File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
