In this paper we propose and study a family of continuous wavelets on general domains, and a corresponding stochastic discretization that we call Monte Carlo wavelets. First, using tools from the theory of reproducing kernel Hilbert spaces and associated integral operators, we define a family of continuous wavelets by spectral calculus. Then, we propose a stochastic discretization based on Monte Carlo estimates of integral operators. Using concentration of measure results, we establish the convergence of such a discretization and derive convergence rates under natural regularity assumptions.

Kereta, Z., Vigogna, S., Naumova, V., Rosasco, L., De Vito, E. (2019). Monte Carlo wavelets: A randomized approach to frame discretization. In 2019 13th International Conference on Sampling Theory and Applications, SampTA 2019. 345 E 47TH ST, NEW YORK, NY 10017 USA : Institute of Electrical and Electronics Engineers [10.1109/SampTA45681.2019.9030825].

Monte Carlo wavelets: A randomized approach to frame discretization

Vigogna S.;
2019-01-01

Abstract

In this paper we propose and study a family of continuous wavelets on general domains, and a corresponding stochastic discretization that we call Monte Carlo wavelets. First, using tools from the theory of reproducing kernel Hilbert spaces and associated integral operators, we define a family of continuous wavelets by spectral calculus. Then, we propose a stochastic discretization based on Monte Carlo estimates of integral operators. Using concentration of measure results, we establish the convergence of such a discretization and derive convergence rates under natural regularity assumptions.
13th International Conference on Sampling Theory and Applications, SampTA 2019
fra
2019
13
Rilevanza internazionale
2019
Settore MAT/06
English
Intervento a convegno
Kereta, Z., Vigogna, S., Naumova, V., Rosasco, L., De Vito, E. (2019). Monte Carlo wavelets: A randomized approach to frame discretization. In 2019 13th International Conference on Sampling Theory and Applications, SampTA 2019. 345 E 47TH ST, NEW YORK, NY 10017 USA : Institute of Electrical and Electronics Engineers [10.1109/SampTA45681.2019.9030825].
Kereta, Z; Vigogna, S; Naumova, V; Rosasco, L; De Vito, E
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/361671
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