Further improvement of phase change memory devices based on Ge-Sb-Te alloys imposes the reduction of the active cell dimensions to the nanoscale. We investigate the atomic arrangement of Ge(1)Sb(2)Te(4) and Ge(2)Sb(2)Te(5) nanowires. We identify the stacking sequence in each crystal structure by combining the direct observation by High Angle Annular Dark Field imaging and proper simulations. We find out that Ge and Sb atoms randomly share the same lattice sites, although this configuration is considered not stable according to the existing theoretical models elaborated for the bulk material.

Rotunno, E., Lazzarini, L., Longo, M., Grillo, V. (2013). Crystal structure assessment of Ge-Sb-Te phase change nanowires. NANOSCALE, 5(4), 1557-1563 [10.1039/C2NR32907G].

Crystal structure assessment of Ge-Sb-Te phase change nanowires

Longo, M.;
2013-01-01

Abstract

Further improvement of phase change memory devices based on Ge-Sb-Te alloys imposes the reduction of the active cell dimensions to the nanoscale. We investigate the atomic arrangement of Ge(1)Sb(2)Te(4) and Ge(2)Sb(2)Te(5) nanowires. We identify the stacking sequence in each crystal structure by combining the direct observation by High Angle Annular Dark Field imaging and proper simulations. We find out that Ge and Sb atoms randomly share the same lattice sites, although this configuration is considered not stable according to the existing theoretical models elaborated for the bulk material.
2013
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03
English
Con Impact Factor ISI
Rotunno, E., Lazzarini, L., Longo, M., Grillo, V. (2013). Crystal structure assessment of Ge-Sb-Te phase change nanowires. NANOSCALE, 5(4), 1557-1563 [10.1039/C2NR32907G].
Rotunno, E; Lazzarini, L; Longo, M; Grillo, V
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/349206
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