An analysis is presented of the small-signal stability of the class of three-port networks derived by making the reference node of a two-port accessible. That class of networks is of particular interest since it includes, under rather mild conditions, any high-frequency active device when viewed as a three-port, i.e., when accessed also from the source (or emitter) terminal. The discussion here presented is completely based on a black-box (S-parameter) representation of the original two-port network, rather than on its small-signal equivalent circuit (SSEC). In a sense, this study complements a previous paper addressing small-signal active device stability from a SSEC standpoint. On the other hand, it is more general (not being based on a specific circuit topology) and more easy-to-use (not requiring the knowledge of the SSEC).

Colangeli, S., Longhi, P.e., Ciccognani, W., Serino, A., Limiti, E. (2022). Checking Rollett's Proviso for Degenerated Devices through S-Parameter Analysis. In 2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022 (pp.236-239). Institute of Electrical and Electronics Engineers Inc. [10.23919/EuMIC54520.2022.9923453].

Checking Rollett's Proviso for Degenerated Devices through S-Parameter Analysis

Colangeli S.;Longhi P. E.;Ciccognani W.;Serino A.;Limiti E.
2022-01-01

Abstract

An analysis is presented of the small-signal stability of the class of three-port networks derived by making the reference node of a two-port accessible. That class of networks is of particular interest since it includes, under rather mild conditions, any high-frequency active device when viewed as a three-port, i.e., when accessed also from the source (or emitter) terminal. The discussion here presented is completely based on a black-box (S-parameter) representation of the original two-port network, rather than on its small-signal equivalent circuit (SSEC). In a sense, this study complements a previous paper addressing small-signal active device stability from a SSEC standpoint. On the other hand, it is more general (not being based on a specific circuit topology) and more easy-to-use (not requiring the knowledge of the SSEC).
17th European Microwave Integrated Circuits Conference, EuMIC 2022
ita
2022
Rilevanza internazionale
2022
Settore ING-INF/01 - ELETTRONICA
English
Ohtomo's test
Rollett's proviso
small-signal stability
Intervento a convegno
Colangeli, S., Longhi, P.e., Ciccognani, W., Serino, A., Limiti, E. (2022). Checking Rollett's Proviso for Degenerated Devices through S-Parameter Analysis. In 2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022 (pp.236-239). Institute of Electrical and Electronics Engineers Inc. [10.23919/EuMIC54520.2022.9923453].
Colangeli, S; Longhi, Pe; Ciccognani, W; Serino, A; Limiti, E
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/315769
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