Atomic force microscopy is gaining interest as a technique to quantitatively study biological samples in native environment. However, the measuring principles behind may cause the presence of different sources of artifacts and image degradations. In this work, we present an AFM image analysis tool able to recognize morphological alterations in human leukemia cells after 3 h incubation with the antioxidant cerium oxide nanoparticles. To demonstrate the robustness of the approach to a particular artifact called contrast reversal (CR) effect, consisting in an unexpected switching between repulsive and attractive tip regime during scanning, we present a technique to artificially inject the artefact on the image and then apply the tool. Maximum area under the ROC (AUC) curve results of 0.91 (0.11) in the discrimination between exposed and unexposed cells confirm the validity of the approach and its applicability in AFM-based cell studies.

Mencattini, A., Casti, P., Fazio, G., Martinelli, E., Di Natale, C., Ghibelli, L., et al. (2017). AFM-based robust image analysis to contrast reversal effects in cell-cerium oxide nanoparticles interactions. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings (pp.1-5). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2017.7969970].

AFM-based robust image analysis to contrast reversal effects in cell-cerium oxide nanoparticles interactions

Mencattini A.;Casti P.;Fazio G.;Martinelli E.;Di Natale C.;Ghibelli L.;
2017-01-01

Abstract

Atomic force microscopy is gaining interest as a technique to quantitatively study biological samples in native environment. However, the measuring principles behind may cause the presence of different sources of artifacts and image degradations. In this work, we present an AFM image analysis tool able to recognize morphological alterations in human leukemia cells after 3 h incubation with the antioxidant cerium oxide nanoparticles. To demonstrate the robustness of the approach to a particular artifact called contrast reversal (CR) effect, consisting in an unexpected switching between repulsive and attractive tip regime during scanning, we present a technique to artificially inject the artefact on the image and then apply the tool. Maximum area under the ROC (AUC) curve results of 0.91 (0.11) in the discrimination between exposed and unexposed cells confirm the validity of the approach and its applicability in AFM-based cell studies.
2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017
Politecnico di Torino, ita
2017
IEEE
Rilevanza internazionale
contributo
Settore ING-INF/07
English
Atomic force microscopy
Contrast reversal effect
Image analysis
Image segmentation
Intervento a convegno
Mencattini, A., Casti, P., Fazio, G., Martinelli, E., Di Natale, C., Ghibelli, L., et al. (2017). AFM-based robust image analysis to contrast reversal effects in cell-cerium oxide nanoparticles interactions. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings (pp.1-5). Institute of Electrical and Electronics Engineers Inc. [10.1109/I2MTC.2017.7969970].
Mencattini, A; Casti, P; Fazio, G; Martinelli, E; Di Natale, C; Ghibelli, L; Cricenti, A; Luce, M
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/265389
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