This paper proposes a method to calculate the yield of a memristor based sensor array considered as the probability that the chip provides acceptable sensing results when the array is affected by manufacturing defects. The modeling is based on a Markov Chain approach, in which each state represents an operating chip configuration and the state transitions take into account manufacturing defects. The proposed method is applicable to evaluate the yield with different fault models to achieve the comparative yield obtained by several redundancy allocations.
Gupta, V., Khandelwal, S., Panunzi, G., Martinelli, E., Hamdioui, S., Jabir, A., et al. (2020). Yield Estimation of a Memristive Sensor Array. In 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp.1-2). IEEE [10.1109/IOLTS50870.2020.9159727].
Yield Estimation of a Memristive Sensor Array
Martinelli E.;Ottavi M.
2020-01-01
Abstract
This paper proposes a method to calculate the yield of a memristor based sensor array considered as the probability that the chip provides acceptable sensing results when the array is affected by manufacturing defects. The modeling is based on a Markov Chain approach, in which each state represents an operating chip configuration and the state transitions take into account manufacturing defects. The proposed method is applicable to evaluate the yield with different fault models to achieve the comparative yield obtained by several redundancy allocations.| File | Dimensione | Formato | |
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