Reflectance anisotropy spectroscopy (RAS) has been recently used to investigate organic compounds, similarly to what has been already done in the case of inorganic semiconductors and metals. An important development is the application of RAS to monitor in real time the growth of thin organic layers in ultra-high vacuum (UHV). In this paper, we discuss the main characteristics of RAS spectroscopy, underlining its peculiar advantages with respect to other techniques. Then, we present recent results obtained by following in situ the deposition of an ordered organic film in UHV, namely alpha-sexithiophene films onto potassium acid phthalate. (C) 2004 Elsevier B.V. All rights reserved.
Goletti, C., Bussetti, G., Chiaradia, P., Sassella, A., Borghesi, A. (2004). The application of reflectance anisotropy spectroscopy to organics deposition. In Organic Electronics: physics, materials, applications (pp.73-81) [10.1016/j.orgel.2004.01.002].
The application of reflectance anisotropy spectroscopy to organics deposition
GOLETTI, CLAUDIO;BUSSETTI, GIANLORENZO;CHIARADIA, PIETRO;
2004-01-01
Abstract
Reflectance anisotropy spectroscopy (RAS) has been recently used to investigate organic compounds, similarly to what has been already done in the case of inorganic semiconductors and metals. An important development is the application of RAS to monitor in real time the growth of thin organic layers in ultra-high vacuum (UHV). In this paper, we discuss the main characteristics of RAS spectroscopy, underlining its peculiar advantages with respect to other techniques. Then, we present recent results obtained by following in situ the deposition of an ordered organic film in UHV, namely alpha-sexithiophene films onto potassium acid phthalate. (C) 2004 Elsevier B.V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
