On-chip SRAM array occupies a large area in the microprocessor ICs. This enforces the technology to reach nano-scale domain. In this domain, minimizing the short channel effects, leakage current and improving reliability of memory cell are significant and challenging. FinFET device reduces the short channel effects, leakage current and enhances the performance of the SRAM cell at 45nm technology node and beyond. This paper presents supply voltage management technique for designing a low-power and variability-aware SRAM cell. In this paper, we propose a FinFET based differential 10T SRAM cell using Drowsy Cache architecture for leakage power reduction at 45nm technology node. The proposed differential 10 T SRAM permits bit interleaving with column-wise write access control, having differential read path, thus, improving reliability of the SRAM cell. The proposed circuit also restricts pseudoread problem, by allowing column-wise write in SRAM cell array. The simulation has been carried out on Cadence Virtuoso at 45nm technology node.

Gupta, V., Khandelwal, S., Mathew, J., Ottavi, M. (2018). 45nm Bit-Interleaving Differential 10T Low Leakage FinFET Based SRAM with Column-Wise Write Access Control. In 2018 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT) (pp.1-6). IEEE [10.1109/DFT.2018.8602981].

45nm Bit-Interleaving Differential 10T Low Leakage FinFET Based SRAM with Column-Wise Write Access Control

Ottavi M.
2018-01-01

Abstract

On-chip SRAM array occupies a large area in the microprocessor ICs. This enforces the technology to reach nano-scale domain. In this domain, minimizing the short channel effects, leakage current and improving reliability of memory cell are significant and challenging. FinFET device reduces the short channel effects, leakage current and enhances the performance of the SRAM cell at 45nm technology node and beyond. This paper presents supply voltage management technique for designing a low-power and variability-aware SRAM cell. In this paper, we propose a FinFET based differential 10T SRAM cell using Drowsy Cache architecture for leakage power reduction at 45nm technology node. The proposed differential 10 T SRAM permits bit interleaving with column-wise write access control, having differential read path, thus, improving reliability of the SRAM cell. The proposed circuit also restricts pseudoread problem, by allowing column-wise write in SRAM cell array. The simulation has been carried out on Cadence Virtuoso at 45nm technology node.
31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018
2018
Rilevanza internazionale
2018
Settore ING-INF/01 - ELETTRONICA
English
Intervento a convegno
Gupta, V., Khandelwal, S., Mathew, J., Ottavi, M. (2018). 45nm Bit-Interleaving Differential 10T Low Leakage FinFET Based SRAM with Column-Wise Write Access Control. In 2018 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT) (pp.1-6). IEEE [10.1109/DFT.2018.8602981].
Gupta, V; Khandelwal, S; Mathew, J; Ottavi, M
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/224871
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