Memristors are an attractive option for use in future architectures due to their non-volatility, high density and low power operation. Gas sensing is one of the proposed application of memristive devices. In spite of these advantages, memristors are susceptible to defect densities due to the nondeterministic nature of nano-scale fabrication. In this paper, a novel spice memristor model incorporating fault models that emulates the gas sensing behaviour with/without faults is developed for simulation and integration with design automation tools. Our simulation results show that the proposed non-linear model detects the presence of the oxidising/reducing gas and analyses the defects/faults affecting the functionality of the sensor.

Khandelwal, S., Bala, A., Gupta, V., Ottavi, M., Martinelli, E., Jabir, A. (2019). Fault modeling and simulation of memristor based gas sensors. In 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp.58-59). IEEE [10.1109/IOLTS.2019.8854459].

Fault modeling and simulation of memristor based gas sensors

Ottavi M.;Martinelli E.;
2019-01-01

Abstract

Memristors are an attractive option for use in future architectures due to their non-volatility, high density and low power operation. Gas sensing is one of the proposed application of memristive devices. In spite of these advantages, memristors are susceptible to defect densities due to the nondeterministic nature of nano-scale fabrication. In this paper, a novel spice memristor model incorporating fault models that emulates the gas sensing behaviour with/without faults is developed for simulation and integration with design automation tools. Our simulation results show that the proposed non-linear model detects the presence of the oxidising/reducing gas and analyses the defects/faults affecting the functionality of the sensor.
IEEE 25th International Symposium on on-line testing and robust system design, IOLTS 2019
2019
Rilevanza internazionale
2019
Settore ING-INF/01 - ELETTRONICA
English
Intervento a convegno
Khandelwal, S., Bala, A., Gupta, V., Ottavi, M., Martinelli, E., Jabir, A. (2019). Fault modeling and simulation of memristor based gas sensors. In 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (pp.58-59). IEEE [10.1109/IOLTS.2019.8854459].
Khandelwal, S; Bala, A; Gupta, V; Ottavi, M; Martinelli, E; Jabir, A
File in questo prodotto:
File Dimensione Formato  
08854459.pdf

solo utenti autorizzati

Tipologia: Documento in Post-print
Licenza: Copyright dell'editore
Dimensione 82.67 kB
Formato Adobe PDF
82.67 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/224851
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 8
  • ???jsp.display-item.citation.isi??? 8
social impact