The emission of commercial solid-state lasers is shifted by Raman lasers to selected wavelengths suitable for trace gas detection. High power Raman lasers based on Ba(NO3)2, diamond and silicon detect CO2, O3and H2O. Raman lasers base on the physical effect of stimulated Raman scattering. Two new Raman crystals (Spodumene and LuAlO3) are investigated and their SRS-spectra is shown.

Zesch, C., Schrader, S., Prosposito, P., Lux, O., Eichler, H.j. (2018). Raman lasers for trace gas detection. In Proceedings of SPIE - The International Society for Optical Engineering (pp.41). 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA : SPIE [10.1117/12.2522463].

Raman lasers for trace gas detection

Prosposito, Paolo;
2018-01-01

Abstract

The emission of commercial solid-state lasers is shifted by Raman lasers to selected wavelengths suitable for trace gas detection. High power Raman lasers based on Ba(NO3)2, diamond and silicon detect CO2, O3and H2O. Raman lasers base on the physical effect of stimulated Raman scattering. Two new Raman crystals (Spodumene and LuAlO3) are investigated and their SRS-spectra is shown.
22nd International Symposium on High Power Laser Systems and Applications, HPLS and A 2018
Villa Mondragone, ita
2018
EI.En. SpA
Rilevanza internazionale
2018
Settore FIS/03 - FISICA DELLA MATERIA
Settore FIS/07 - FISICA APPLICATA (A BENI CULTURALI, AMBIENTALI, BIOLOGIA E MEDICINA)
Settore ING-IND/22 - SCIENZA E TECNOLOGIA DEI MATERIALI
Settore ING-IND/23 - CHIMICA FISICA APPLICATA
English
Barium nitrate; diamond; Raman lasers; silicon; Stimulated Raman Scattering; trace gas detection; Electronic, Optical and Magnetic Materials; Condensed Matter Physics; Computer Science Applications1707 Computer Vision and Pattern Recognition; Applied Mathematics; Electrical and Electronic Engineering
http://spie.org/x1848.xml
Intervento a convegno
Zesch, C., Schrader, S., Prosposito, P., Lux, O., Eichler, H.j. (2018). Raman lasers for trace gas detection. In Proceedings of SPIE - The International Society for Optical Engineering (pp.41). 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA : SPIE [10.1117/12.2522463].
Zesch, C; Schrader, S; Prosposito, P; Lux, O; Eichler, Hj
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/211045
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