In this paper we present the methodology and the numerical results related to the analysis of aging of the SU- 8 polymer when used as a primary layer for the realization of Coplanar Waveguide (CPW) structures. As test devices, we used a set of transmission lines with different lengths and T-shaped open stubs shunt resonators; by using these geometries, we are able to acquire the data in a broadband range, in principle between 1 GHz and 40 GHz. We conduct the analysis by comparing two different technology run: the first wafer with a deposited layer by a 12-year-old SU-8 and the second wafer, with the same photolithographed metallic geometries, with a brand-new processed SU-8 photoresist.
Lucibello, A., Sardi, G., Proietti, E., Marcelli, R., Bartolucci, G. (2017). Microwave broadband characterization of aging of SU-8 polymer as CPW substrate. In Proceedings of the International Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2017 (pp.1-4). IEEE [10.1109/DTIP.2017.7984492].
Microwave broadband characterization of aging of SU-8 polymer as CPW substrate
A. Lucibello;G. Bartolucci
2017-05-01
Abstract
In this paper we present the methodology and the numerical results related to the analysis of aging of the SU- 8 polymer when used as a primary layer for the realization of Coplanar Waveguide (CPW) structures. As test devices, we used a set of transmission lines with different lengths and T-shaped open stubs shunt resonators; by using these geometries, we are able to acquire the data in a broadband range, in principle between 1 GHz and 40 GHz. We conduct the analysis by comparing two different technology run: the first wafer with a deposited layer by a 12-year-old SU-8 and the second wafer, with the same photolithographed metallic geometries, with a brand-new processed SU-8 photoresist.File | Dimensione | Formato | |
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