Gas sensing is one of the proposed application field of memristive devices. We used a crossbar array of memristors as gas sensor using the HP labs fabricated TiO2 based memristor model in an attempt to improve sensing accuracy. We introduced the possibility of reliable multiple gases detection using multiple rows of memristors as separate sensor in a crossbar array. Our experimental results show that an array of memristors can minimise measurement errors as well as provide a good redundancy measure during gas sensing. Measurements taken from the sensors are also not affected by alternate current paths problem often experienced in crossbar architecture.

Adeyemo, A., Jabir, A., Mathew, J., Martinelli, E., Di Natale, C., & Ottavi, M. (2017). Reliable gas sensing with memristive array. In IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2017 (pp.244-246). IEEE [10.1109/IOLTS.2017.8046228].

Reliable gas sensing with memristive array

Martinelli E.;Di Natale C.;Ottavi M.
2017

Abstract

Gas sensing is one of the proposed application field of memristive devices. We used a crossbar array of memristors as gas sensor using the HP labs fabricated TiO2 based memristor model in an attempt to improve sensing accuracy. We introduced the possibility of reliable multiple gases detection using multiple rows of memristors as separate sensor in a crossbar array. Our experimental results show that an array of memristors can minimise measurement errors as well as provide a good redundancy measure during gas sensing. Measurements taken from the sensors are also not affected by alternate current paths problem often experienced in crossbar architecture.
23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017
Rilevanza internazionale
Settore ING-INF/01 - Elettronica
English
Intervento a convegno
Adeyemo, A., Jabir, A., Mathew, J., Martinelli, E., Di Natale, C., & Ottavi, M. (2017). Reliable gas sensing with memristive array. In IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2017 (pp.244-246). IEEE [10.1109/IOLTS.2017.8046228].
Adeyemo, A; Jabir, A; Mathew, J; Martinelli, E; Di Natale, C; Ottavi, M
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2108/193218
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