This paper presents an intended test setup and methodology for testing micro-controller SoCs against the effects of ionizing radiations. The method structure is based on a modular test sequence for test definition, coding, validation and setup. It will be illustrated by the relevant example of a microcontroller solution including lockstep options. Our methodology proposes using low-energy protons for irradiation, and this paper compares this approach with current techniques, showing how proton testing is becoming increasingly interesting, especially for ultra-deep submicron processes in proton dominated environments like low-shielded Low Earth Orbit missions or aircraft avionics. Beyond the convenience of a simplified test setup one of the main advantages of the proton irradiation approach is that it can be used for simultaneous Single Event Effects (SEE) and Total Ionizing Dose (TID) characterization, closer to the "test as you fly" approach.

Di Mascio, S., Ottavi, M., Furano, G., Szewczyk, T., Menicucci, A., Campajola, L., et al. (2016). Qualitative techniques for System-on-Chip test with low-energy protons. In International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), 2016 (pp.1-6). IEEE [10.1109/DTIS.2016.7483812].

Qualitative techniques for System-on-Chip test with low-energy protons

OTTAVI, MARCO;
2016-01-01

Abstract

This paper presents an intended test setup and methodology for testing micro-controller SoCs against the effects of ionizing radiations. The method structure is based on a modular test sequence for test definition, coding, validation and setup. It will be illustrated by the relevant example of a microcontroller solution including lockstep options. Our methodology proposes using low-energy protons for irradiation, and this paper compares this approach with current techniques, showing how proton testing is becoming increasingly interesting, especially for ultra-deep submicron processes in proton dominated environments like low-shielded Low Earth Orbit missions or aircraft avionics. Beyond the convenience of a simplified test setup one of the main advantages of the proton irradiation approach is that it can be used for simultaneous Single Event Effects (SEE) and Total Ionizing Dose (TID) characterization, closer to the "test as you fly" approach.
11th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2016
tur
2016
Rilevanza internazionale
2016
Settore ING-INF/01 - ELETTRONICA
English
Intervento a convegno
Di Mascio, S., Ottavi, M., Furano, G., Szewczyk, T., Menicucci, A., Campajola, L., et al. (2016). Qualitative techniques for System-on-Chip test with low-energy protons. In International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), 2016 (pp.1-6). IEEE [10.1109/DTIS.2016.7483812].
Di Mascio, S; Ottavi, M; Furano, G; Szewczyk, T; Menicucci, A; Campajola, L; Di Capua, F
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/163190
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