In this paper RF MEMS switches in coplanar waveguide (CPW) configuration designed for redundancy space applications have been analyzed, to demonstrate their reliability in terms of microwave performances when subjected to DC actuations up to one million cycles. As a result, both the investigated structures fulfill the current electrical requirements expected for redundancy logic purposes.

Lucibello, A., Marcelli, R., Proietti, E., Bartolucci, G., Mulloni, V., Margesin, B. (2013). Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations. In 2013 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (pp.167-172). IEEE.

Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations

BARTOLUCCI, GIANCARLO;
2013-01-01

Abstract

In this paper RF MEMS switches in coplanar waveguide (CPW) configuration designed for redundancy space applications have been analyzed, to demonstrate their reliability in terms of microwave performances when subjected to DC actuations up to one million cycles. As a result, both the investigated structures fulfill the current electrical requirements expected for redundancy logic purposes.
2013 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2013
Barcellona (Spagna)
2013
Rilevanza internazionale
contributo
apr-2013
2013
Settore ING-INF/01 - ELETTRONICA
English
Insertion loss, Loss measurement, Micromechanical devices, Radio frequency, Redundancy, Voltage measurement
Intervento a convegno
Lucibello, A., Marcelli, R., Proietti, E., Bartolucci, G., Mulloni, V., Margesin, B. (2013). Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations. In 2013 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (pp.167-172). IEEE.
Lucibello, A; Marcelli, R; Proietti, E; Bartolucci, G; Mulloni, V; Margesin, B
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/109212
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