W is a promising material to use as protection for thermal shields in future nuclear fusion reactors, however the joining to other metals is really challenging. For realizing such joints plasma spraying (PS) has been used for its simplicity, the possibility to cover complex and extended surfaces and the relatively low cost. An appropriate interlayer must be optimized to increase the adhesion of W on the substrates and to provide a soft interface for better thermo-mechanical compatibility. The present work demonstrates that high-temperature X-ray diffraction (HT-XRD) permits to quickly assess the reliability and quality of the coating-interlayer-substrate system by measuring the strain of coating. This is very useful to orientate the work for optimizing the structure and composition of the interlayer and the parameters of deposition process.
Costanza, G., Donnini, R., Kaciulis, S., Maddaluno, G., Montanari, R. (2014). HT-XRD analysis of W thick coatings for nuclear fusion technology. In Materials and applications for sensors and transducers 3. (pp.31-34). Scientific.Net [10.4028/www.scientific.net/KEM.605.31].
HT-XRD analysis of W thick coatings for nuclear fusion technology
COSTANZA, GIROLAMO;MONTANARI, ROBERTO
2014-01-01
Abstract
W is a promising material to use as protection for thermal shields in future nuclear fusion reactors, however the joining to other metals is really challenging. For realizing such joints plasma spraying (PS) has been used for its simplicity, the possibility to cover complex and extended surfaces and the relatively low cost. An appropriate interlayer must be optimized to increase the adhesion of W on the substrates and to provide a soft interface for better thermo-mechanical compatibility. The present work demonstrates that high-temperature X-ray diffraction (HT-XRD) permits to quickly assess the reliability and quality of the coating-interlayer-substrate system by measuring the strain of coating. This is very useful to orientate the work for optimizing the structure and composition of the interlayer and the parameters of deposition process.File | Dimensione | Formato | |
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