In this work, the effect of reverse bias stress tests on Dye Solar Cells (DSCs) based on N719 dye was investigated in detail using resonant micro-Raman spectroscopy. First the Raman lines were assigned to vibrations from the different constituents in a fresh solar cell. Then the mechanism of thiocyanato (SCN-) loss under stress conditions was reported. (C) 2012 Elsevier Ltd. All rights reserved.
Quatela, A., Agresti, A., Mastroianni, S., Pescetelli, S., Brown, T.m., Reale, A., et al. (2012). Fabrication and reliability of dye solar cells: A resonance Raman scattering study. In Microelectronics Reliability: Special issue 23rd European symposium on the reliability of electron devices, failure physics and analysis (pp.2487-2489). Elsevier [10.1016/j.microrel.2012.06.150].
Fabrication and reliability of dye solar cells: A resonance Raman scattering study
QUATELA, ALESSIA;Agresti, A;PESCETELLI, SARA;BROWN, THOMAS MEREDITH;REALE, ANDREA;DI CARLO, ALDO
2012-01-01
Abstract
In this work, the effect of reverse bias stress tests on Dye Solar Cells (DSCs) based on N719 dye was investigated in detail using resonant micro-Raman spectroscopy. First the Raman lines were assigned to vibrations from the different constituents in a fresh solar cell. Then the mechanism of thiocyanato (SCN-) loss under stress conditions was reported. (C) 2012 Elsevier Ltd. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
