The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.

Simion, S., Marcelli, R., Sajin, G., Bartolucci, G., Craciunoiu, F. (2009). A method for on-wafer experimental characterization of a 4-port circuit, using a 2-port vector network analyzer. ROMANIAN JOURNAL OF INFORMATION SCIENCE AND TECHNOLOGY, 12(3), 394-401.

A method for on-wafer experimental characterization of a 4-port circuit, using a 2-port vector network analyzer

BARTOLUCCI, GIANCARLO;
2009-01-01

Abstract

The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
2009
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore ING-INF/01 - ELETTRONICA
English
Con Impact Factor ISI
CRLH coupler; On-wafer measurement; Scattering matrices; Vector network analyzer
Simion, S., Marcelli, R., Sajin, G., Bartolucci, G., Craciunoiu, F. (2009). A method for on-wafer experimental characterization of a 4-port circuit, using a 2-port vector network analyzer. ROMANIAN JOURNAL OF INFORMATION SCIENCE AND TECHNOLOGY, 12(3), 394-401.
Simion, S; Marcelli, R; Sajin, G; Bartolucci, G; Craciunoiu, F
Articolo su rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/95430
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