This document introduces the special Section on “ Defect and Fault Tolerance (DFT) in VLSI and Nanotechnology Systems” to the readership of IEEE TRANSACTION ON NANOTECHNOLOGY (TNANO).
Ottavi, M., Park, N. (2013). Introduction to the special section. IEEE TRANSACTIONS ON NANOTECHNOLOGY, 12(4), 475-476 [10.1109/TNANO.2013.2262732].
Introduction to the special section
OTTAVI, MARCO;
2013-01-01
Abstract
This document introduces the special Section on “ Defect and Fault Tolerance (DFT) in VLSI and Nanotechnology Systems” to the readership of IEEE TRANSACTION ON NANOTECHNOLOGY (TNANO).File in questo prodotto:
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