At SPARC-LAB,we have installed an Electro-Optic Sampling(EOS)experiment for single shot,non- destructive measurements of the longitudinal distribution charge of individual electron bunches.The profile of the electron bunch field is electro-optically encoded into aTi:Sa laser, having 130fs(rms)pulse length, directly derived from the photocathode's laser. The bunch profile information is spatially retrieved,i.e.,the laser crosses with an angle of 30 degrees with respect to the normal to the surface of EO crystal(ZnTe,GaP)and the bunch longitudinal profile is mapped into the laser's transverse profile. In particular,we used the EOS for a single-shot direct visualization of the time profile of a comb-like electron beam,consisting of two bunches, about 100fs(rms)long,sub-picosecond spaced with a total charge of 160pC. The electro-optic measurements(done with both ZnTe and GaP crystals)have been validated with both RF Deflector (RFD)and Michelson interferometer measurements.

Pompili, R., Cianchi, A., Alesini, D., Anania, M., Bacci, A., Bellaveglia, M., et al. (2013). First single-shot and non-intercepting longitudinal bunch diagnostics for comb-like beam by means of Electro-Optic Sampling. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, 740, 216 [10.1016/j.nima.2013.10.031].

First single-shot and non-intercepting longitudinal bunch diagnostics for comb-like beam by means of Electro-Optic Sampling

CIANCHI, ALESSANDRO;
2013-10-26

Abstract

At SPARC-LAB,we have installed an Electro-Optic Sampling(EOS)experiment for single shot,non- destructive measurements of the longitudinal distribution charge of individual electron bunches.The profile of the electron bunch field is electro-optically encoded into aTi:Sa laser, having 130fs(rms)pulse length, directly derived from the photocathode's laser. The bunch profile information is spatially retrieved,i.e.,the laser crosses with an angle of 30 degrees with respect to the normal to the surface of EO crystal(ZnTe,GaP)and the bunch longitudinal profile is mapped into the laser's transverse profile. In particular,we used the EOS for a single-shot direct visualization of the time profile of a comb-like electron beam,consisting of two bunches, about 100fs(rms)long,sub-picosecond spaced with a total charge of 160pC. The electro-optic measurements(done with both ZnTe and GaP crystals)have been validated with both RF Deflector (RFD)and Michelson interferometer measurements.
26-ott-2013
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/01 - FISICA SPERIMENTALE
English
Con Impact Factor ISI
Pompili, R., Cianchi, A., Alesini, D., Anania, M., Bacci, A., Bellaveglia, M., et al. (2013). First single-shot and non-intercepting longitudinal bunch diagnostics for comb-like beam by means of Electro-Optic Sampling. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, 740, 216 [10.1016/j.nima.2013.10.031].
Pompili, R; Cianchi, A; Alesini, D; Anania, M; Bacci, A; Bellaveglia, M; Castellano, M; Chiadroni, E; Di Giovenale, D; Dipirro, G; Gatti, G; Giorgiann...espandi
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/87932
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