The requirement of low impedances in most integrated circuits is solved through the use of straight stubs, treating them as one-dimensional structures. The inadequacy of that approach can be overcome by adopting a complete modal theory—and the corresponding synthesis tools—developed to characterize those electromagnetic aspects deriving from the “planarity” of the structure. The simulations performed adopting both commercial CAD packages and the modal approach have been compared with some experiments and the need for a better characterization for the presently available cross-junction element models has been pointed out.

Giannini, F., Bartolucci, G., Ruggieri, M. (1989). Low-impedance matching: The straight stub solution. MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2(3), 96-101 [10.1002/mop.4650020307].

Low-impedance matching: The straight stub solution

GIANNINI, FRANCO;BARTOLUCCI, GIANCARLO;RUGGIERI, MARINA
1989-03-01

Abstract

The requirement of low impedances in most integrated circuits is solved through the use of straight stubs, treating them as one-dimensional structures. The inadequacy of that approach can be overcome by adopting a complete modal theory—and the corresponding synthesis tools—developed to characterize those electromagnetic aspects deriving from the “planarity” of the structure. The simulations performed adopting both commercial CAD packages and the modal approach have been compared with some experiments and the need for a better characterization for the presently available cross-junction element models has been pointed out.
mar-1989
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore ING-INF/01 - ELETTRONICA
English
Con Impact Factor ISI
Straight stub;low impedance; modal theory; analysis
Giannini, F., Bartolucci, G., Ruggieri, M. (1989). Low-impedance matching: The straight stub solution. MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2(3), 96-101 [10.1002/mop.4650020307].
Giannini, F; Bartolucci, G; Ruggieri, M
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/64990
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