We have followed the evolution of strained Ge/Si(111) Stranski-Krastanov islands by atomic force and scanning tunneling microscopies. Following the morphological evolution during the annealing of the samples we were able to recognize the key features of the relaxation process in these structures. The introduction of edge misfit dislocations after a critical thickness, and the inhomogeneous strain field inside the islands, lead to an intra-island ripening mechanism. We show that this mechanism changes the island shape from truncated tetrahedron to `atoll-like'.

Capellini, G., Motta, N., Sgarlata, A., Calarco, R. (1999). Evolution of strained Ge islands grown on Si(111): a scanning probe microscopy study. SOLID STATE COMMUNICATIONS, 112(3), 145-149 [10.1016/S0038-1098(99)00316-6].

Evolution of strained Ge islands grown on Si(111): a scanning probe microscopy study

SGARLATA, ANNA;
1999-01-01

Abstract

We have followed the evolution of strained Ge/Si(111) Stranski-Krastanov islands by atomic force and scanning tunneling microscopies. Following the morphological evolution during the annealing of the samples we were able to recognize the key features of the relaxation process in these structures. The introduction of edge misfit dislocations after a critical thickness, and the inhomogeneous strain field inside the islands, lead to an intra-island ripening mechanism. We show that this mechanism changes the island shape from truncated tetrahedron to `atoll-like'.
1999
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - FISICA DELLA MATERIA
English
Annealing; Atomic force microscopy; Dislocations (crystals); Morphology; Nanostructured materials; Relaxation processes; Scanning tunneling microscopy; Semiconductor growth; Silicon wafers; Strain; Stranski-Krastanov islands; Semiconducting germanium
Capellini, G., Motta, N., Sgarlata, A., Calarco, R. (1999). Evolution of strained Ge islands grown on Si(111): a scanning probe microscopy study. SOLID STATE COMMUNICATIONS, 112(3), 145-149 [10.1016/S0038-1098(99)00316-6].
Capellini, G; Motta, N; Sgarlata, A; Calarco, R
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/57827
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