To investigate the effect of surface patterning on island growth, a real-time study by scanning tunneling microscopy (STM) of Ge deposition on nanostructured Si(001) surfaces is presented. The substrate is nanopatterned by the STM tip and the subsequent evolution of a Ge layer deposited at 500 degreesC is recorded. The formation of the wetting layer, a transition stage and the growth of three-dimensional (3D) Ge huts are examined dynamically. The 2D-3D transition is described in terms of the nucleation and evolution of pre-pyramids consisting of (001) oriented terraces, which eventually transform into pyramids by successive introduction of {105} facets. Substrate patterning strongly affects the positioning of 3D islands, and represents a route toward ordering of Ge islands.

Szkutnik, P., Sgarlata, A., Nufris, S., Motta, N., Balzarotti, A. (2004). Real-time scanning tunneling microscopy observation of the evolution of Ge quantum dots on nanopatterned Si(001) surfaces. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 69(20) [10.1103/PhysRevB.69.201309].

Real-time scanning tunneling microscopy observation of the evolution of Ge quantum dots on nanopatterned Si(001) surfaces

SGARLATA, ANNA;BALZAROTTI, ADALBERTO
2004-01-01

Abstract

To investigate the effect of surface patterning on island growth, a real-time study by scanning tunneling microscopy (STM) of Ge deposition on nanostructured Si(001) surfaces is presented. The substrate is nanopatterned by the STM tip and the subsequent evolution of a Ge layer deposited at 500 degreesC is recorded. The formation of the wetting layer, a transition stage and the growth of three-dimensional (3D) Ge huts are examined dynamically. The 2D-3D transition is described in terms of the nucleation and evolution of pre-pyramids consisting of (001) oriented terraces, which eventually transform into pyramids by successive introduction of {105} facets. Substrate patterning strongly affects the positioning of 3D islands, and represents a route toward ordering of Ge islands.
2004
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - FISICA DELLA MATERIA
English
Con Impact Factor ISI
germanium; silicon; article; nanotechnology; scanning tunneling microscopy; semiconductor; surface property
Szkutnik, P., Sgarlata, A., Nufris, S., Motta, N., Balzarotti, A. (2004). Real-time scanning tunneling microscopy observation of the evolution of Ge quantum dots on nanopatterned Si(001) surfaces. PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS, 69(20) [10.1103/PhysRevB.69.201309].
Szkutnik, P; Sgarlata, A; Nufris, S; Motta, N; Balzarotti, A
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/56542
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