In this study, we establish an accurate growth diagram—describing the phase, composition, and atomic stacking of Ge-Sb-Te alloys (GST)—that can be used as a prediction tool for thin film deposition. This framework for epitaxy at the atomic scale allowsfordesigningtailoredcrystallineGSTphaseswithpreciseatomiclayerstackingconfigurations.Byleveraginginsightsinto phasestability,weoptimizegrowthconditionstoachievehigh-quality,bidimensionalGSTstructuresofdifferentcompositions (Ge2Sb2Te5,Ge3Sb2Te6, andGe1Sb2Te4)andphases(ordered-cubicandtrigonal).Moreover,weexaminetheinfluenceofstructural anisotropiesandinterfaceeffectsonthelow-temperaturemagneto-transportproperties.Theorientationalorderingofthevacancy layersandtheirevolutionintovanderWaalsgapsalterstheelectricalconductiondramatically,plausiblyalsointhepresenceof thetopologicalsurfacestatesandtheircouplingwiththebulkstates.Inaddition,weexaminethereversibletransitionbetween twostableresistancestatesinamemorycellfortheGSTpreciselytailoredbythegrowthusingMolecularBeamEpitaxy(MBE). Itstexturedstructurefavorslowpowerconsumption,makingitapromisingcandidateforphase-changememorytechnology.

Bragaglia, V., Arciprete, F., Prili, S., Takagaki, Y., Mio, A.m., Mazzarello, R., et al. (2026). Atomic‐Scale Epitaxy for Tailoring Crystalline GeSbTe Alloys Into Bidimensional Phases. ADVANCED MATERIALS INTERFACES, 13(1) [10.1002/admi.202500937].

Atomic‐Scale Epitaxy for Tailoring Crystalline GeSbTe Alloys Into Bidimensional Phases

Arciprete, Fabrizio;Prili, Simone
;
2026-01-01

Abstract

In this study, we establish an accurate growth diagram—describing the phase, composition, and atomic stacking of Ge-Sb-Te alloys (GST)—that can be used as a prediction tool for thin film deposition. This framework for epitaxy at the atomic scale allowsfordesigningtailoredcrystallineGSTphaseswithpreciseatomiclayerstackingconfigurations.Byleveraginginsightsinto phasestability,weoptimizegrowthconditionstoachievehigh-quality,bidimensionalGSTstructuresofdifferentcompositions (Ge2Sb2Te5,Ge3Sb2Te6, andGe1Sb2Te4)andphases(ordered-cubicandtrigonal).Moreover,weexaminetheinfluenceofstructural anisotropiesandinterfaceeffectsonthelow-temperaturemagneto-transportproperties.Theorientationalorderingofthevacancy layersandtheirevolutionintovanderWaalsgapsalterstheelectricalconductiondramatically,plausiblyalsointhepresenceof thetopologicalsurfacestatesandtheircouplingwiththebulkstates.Inaddition,weexaminethereversibletransitionbetween twostableresistancestatesinamemorycellfortheGSTpreciselytailoredbythegrowthusingMolecularBeamEpitaxy(MBE). Itstexturedstructurefavorslowpowerconsumption,makingitapromisingcandidateforphase-changememorytechnology.
2026
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03
Settore PHYS-03/A - Fisica sperimentale della materia e applicazioni
English
Con Impact Factor ISI
https://advanced.onlinelibrary.wiley.com/doi/10.1002/admi.202500937
Bragaglia, V., Arciprete, F., Prili, S., Takagaki, Y., Mio, A.m., Mazzarello, R., et al. (2026). Atomic‐Scale Epitaxy for Tailoring Crystalline GeSbTe Alloys Into Bidimensional Phases. ADVANCED MATERIALS INTERFACES, 13(1) [10.1002/admi.202500937].
Bragaglia, V; Arciprete, F; Prili, S; Takagaki, Y; Mio, Am; Mazzarello, R; Boschker, Je; Calarco, R
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/443063
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