The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.

Chiaradia, P., & Del Sole, R. (1999). Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces. SURFACE REVIEW AND LETTERS, 6(3-4), 517-528 [10.1142/S0218625X99000482].

Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces

CHIARADIA, PIETRO;DEL SOLE, RODOLFO
1999

Abstract

The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - Fisica della Materia
English
Con Impact Factor ISI
AB-INITIO CALCULATION; POLARIZATION-DEPENDENT REFLECTIVITY; BANDGAP OPTICAL ANISOTROPIES; SI(111)2X1 SURFACE; SI(111)-(2X1) SURFACE; ULTRAHIGH-VACUUM; GAAS(001) 2X4; ABSORPTION; GAAS(110); STATES
Chiaradia, P., & Del Sole, R. (1999). Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces. SURFACE REVIEW AND LETTERS, 6(3-4), 517-528 [10.1142/S0218625X99000482].
Chiaradia, P; DEL SOLE, R
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2108/43057
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