IRIS

The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.

Chiaradia, P., DEL SOLE, R. (1999). Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces. SURFACE REVIEW AND LETTERS, 6(3-4), 517-528 [10.1142/S0218625X99000482].

Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces

CHIARADIA, PIETRO;DEL SOLE, RODOLFO
1999-01-01

Abstract

The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.
1999
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - FISICA DELLA MATERIA
English
Con Impact Factor ISI
AB-INITIO CALCULATION; POLARIZATION-DEPENDENT REFLECTIVITY; BANDGAP OPTICAL ANISOTROPIES; SI(111)2X1 SURFACE; SI(111)-(2X1) SURFACE; ULTRAHIGH-VACUUM; GAAS(001) 2X4; ABSORPTION; GAAS(110); STATES
Chiaradia, P., DEL SOLE, R. (1999). Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces. SURFACE REVIEW AND LETTERS, 6(3-4), 517-528 [10.1142/S0218625X99000482].
Chiaradia, P; DEL SOLE, R
Articolo su rivista
01 - Articolo su rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/43057
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