Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degrada- tion is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fab- rication step requires higher accuracy.
Paoloni, C. (2008). On the analysis and improvement of yield for TWT small-signal gain. IEEE TRANSACTIONS ON ELECTRON DEVICES, 55(10), 2774-2778 [10.1109/TED.2008.2003083].
On the analysis and improvement of yield for TWT small-signal gain
PAOLONI, CLAUDIO
2008-10-01
Abstract
Traveling-wave tube (TWT) performance is sensibly affected by fabrication tolerances. An accurate yield evaluation and comprehension of the factors that contribute to yield degrada- tion is fundamental to avoid excess costs in the fabrication process. In this paper, a procedure to evaluate and improve the yield of multisection helix TWTs in the design phase will be proposed, assuming a small-signal gain performance goal as the design target. An extended set of fabrication parameters is considered to provide a reliable estimate of the manufacturing tolerance effect on the final result. The introduction of yield sensitivity histograms together with cathode voltage adjustment demonstrates a relevant TWT yield improvement, together with indications on which fab- rication step requires higher accuracy.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
