Magnetic force microscopy has been used to study MnxGe1-x/Ge(100) films grown at 433 K as a function of Mn concentration. Imaging has been performed at room temperature and in zero magnetic field. Magnetic domains with a magnetization direction normal to the surface have been detected for x = 0.027 and 0.044. No clearcut magnetic effect has been observed for x = 0.053. Scanning tunneling microscopy has been used to investigate their morphology. (C) 2003 Elsevier B. V. All rights reserved.
Castrucci, P., Pinto, N., Morresi, L., Gunnella, R., Murri, R., Scarselli, M.a., et al. (2004). Magnetic properties of thin MnGe films investigated by magnetic force microscopy. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 272-276(SUPPL. 1) [10.1016/j.jmmm.2003.12.1112].
Magnetic properties of thin MnGe films investigated by magnetic force microscopy
CASTRUCCI, PAOLA;SCARSELLI, MANUELA ANGELA;DE CRESCENZI, MAURIZIO
2004-01-01
Abstract
Magnetic force microscopy has been used to study MnxGe1-x/Ge(100) films grown at 433 K as a function of Mn concentration. Imaging has been performed at room temperature and in zero magnetic field. Magnetic domains with a magnetization direction normal to the surface have been detected for x = 0.027 and 0.044. No clearcut magnetic effect has been observed for x = 0.053. Scanning tunneling microscopy has been used to investigate their morphology. (C) 2003 Elsevier B. V. All rights reserved.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
