The properties of ZnSe epilayers fabricated by molecular beam epitaxy on lattice-matched InxGa1-xAs buffers grown on GaAs(001) substrates have been investigated by means of photoluminescence spectroscopy and transmission electron microscopy. For suitable values of x and ternary-layer thickness, the partial character of the strain relaxation within the III-V layer can be compensated for, minimizing the residual strain in the ZnSe overlayer. Large reductions in the dislocation density and Y-line emission as compared to conventional ZnSe/GaAs heterostructures can be reproducibly obtained.

Heun, S., Lantier, R., Paggel, J., Sorba, L., Rubini, S., Bonanni, B., et al. (1998). ZnSe growth on lattice-matched InxGa1-xAs substrates. SURFACE REVIEW AND LETTERS, 5(3-4), 693-700 [10.1142/S0218625X98001055].

ZnSe growth on lattice-matched InxGa1-xAs substrates

Bonanni, B;
1998-01-01

Abstract

The properties of ZnSe epilayers fabricated by molecular beam epitaxy on lattice-matched InxGa1-xAs buffers grown on GaAs(001) substrates have been investigated by means of photoluminescence spectroscopy and transmission electron microscopy. For suitable values of x and ternary-layer thickness, the partial character of the strain relaxation within the III-V layer can be compensated for, minimizing the residual strain in the ZnSe overlayer. Large reductions in the dislocation density and Y-line emission as compared to conventional ZnSe/GaAs heterostructures can be reproducibly obtained.
1998
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03 - FISICA DELLA MATERIA
English
Heun, S., Lantier, R., Paggel, J., Sorba, L., Rubini, S., Bonanni, B., et al. (1998). ZnSe growth on lattice-matched InxGa1-xAs substrates. SURFACE REVIEW AND LETTERS, 5(3-4), 693-700 [10.1142/S0218625X98001055].
Heun, S; Lantier, R; Paggel, J; Sorba, L; Rubini, S; Bonanni, B; Franciosi, A; Lomascolo, M; Cingolani, R; Bonard, J; Ganiere, J
Articolo su rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/313795
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