A reflectance anisotropy spectroscopy (RAS) study where the growth of thin films of α-sexithiophene (6T) films onto an organic single crystal substrate was monitored during organic molecular beam deposition (OMBD) in UHV. The experimental reuslts give evidence that this optical technique allows one to follow during growth both the deposited thickness and the evolution of the system electronic properties with an extremely high sensitivity. Thus, 6T was synthesized according to the standard procedure and was purified by sublimation.

Goletti, C., Bussetti, G., Chiaradia, P., Sassella, A., Borghesi, A. (2003). Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition. APPLIED PHYSICS LETTERS, 83(20), 4146-4148 [10.1063/1.1626810].

Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition

GOLETTI, CLAUDIO;BUSSETTI, GIANLORENZO;CHIARADIA, PIETRO;
2003-01-01

Abstract

A reflectance anisotropy spectroscopy (RAS) study where the growth of thin films of α-sexithiophene (6T) films onto an organic single crystal substrate was monitored during organic molecular beam deposition (OMBD) in UHV. The experimental reuslts give evidence that this optical technique allows one to follow during growth both the deposited thickness and the evolution of the system electronic properties with an extremely high sensitivity. Thus, 6T was synthesized according to the standard procedure and was purified by sublimation.
Pubblicato
Rilevanza internazionale
Articolo
Sì, ma tipo non specificato
Settore FIS/03 - Fisica della Materia
English
Con Impact Factor ISI
Anisotropy; Film growth; Molecular beam epitaxy; Monolayers; Optical properties; Reflection; Single crystals; Spectroscopic analysis; Sublimation; Synthesis (chemical); Thickness measurement; Ultrahigh vacuum; Optical monitoring; Organic molecular beam deposition; Reflectance anisotropy spectroscopy; Semiconducting organic compounds
Goletti, C., Bussetti, G., Chiaradia, P., Sassella, A., Borghesi, A. (2003). Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition. APPLIED PHYSICS LETTERS, 83(20), 4146-4148 [10.1063/1.1626810].
Goletti, C; Bussetti, G; Chiaradia, P; Sassella, A; Borghesi, A
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/30935
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