A reflectance anisotropy spectroscopy (RAS) study where the growth of thin films of α-sexithiophene (6T) films onto an organic single crystal substrate was monitored during organic molecular beam deposition (OMBD) in UHV. The experimental reuslts give evidence that this optical technique allows one to follow during growth both the deposited thickness and the evolution of the system electronic properties with an extremely high sensitivity. Thus, 6T was synthesized according to the standard procedure and was purified by sublimation.
Goletti, C., Bussetti, G., Chiaradia, P., Sassella, A., Borghesi, A. (2003). Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition. APPLIED PHYSICS LETTERS, 83(20), 4146-4148 [10.1063/1.1626810].
Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition
GOLETTI, CLAUDIO;BUSSETTI, GIANLORENZO;CHIARADIA, PIETRO;
2003-01-01
Abstract
A reflectance anisotropy spectroscopy (RAS) study where the growth of thin films of α-sexithiophene (6T) films onto an organic single crystal substrate was monitored during organic molecular beam deposition (OMBD) in UHV. The experimental reuslts give evidence that this optical technique allows one to follow during growth both the deposited thickness and the evolution of the system electronic properties with an extremely high sensitivity. Thus, 6T was synthesized according to the standard procedure and was purified by sublimation.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
