SnO2 thin films have been grown by radio frequency reactive sputtering method in order to be used as a gas sensor. Subsequently Pt has been added to the SnO2 films to increase the sensitivity to carbon monoxide gas. Two different substrates have been used: rough and mechanically polished alumina. The morphology of the film has been characterized by atomic force microscopy, whereas the chemical composition was analyzed by x-ray photoemission spectromicroscopy. Pt:SnO2 clusters with widths of 500-600 nm were observed on the rough alumina, whereas on the mechanically polished alumina, the Pt:SnO2 film was smoother. X-ray photoemission spectromicroscopy measurements show for Pt:SnO2 films on rough alumina substrates different charging in different areas of the sample. The response curve to carbon monoxide is 30% higher for rough alumina.

Cricenti, A., Generosi, R., Scarselli, M., Perfetti, P., Siciliano, P., Serra, A., et al. (1996). Pt:SnO2 thin films for gas sensor characterized by atomic force microscopy and x-ray photoemission spectromicroscopy. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B, 14(2), 1527-1530 [10.1116/1.589132].

Pt:SnO2 thin films for gas sensor characterized by atomic force microscopy and x-ray photoemission spectromicroscopy

Scarselli, MA;
1996-01-01

Abstract

SnO2 thin films have been grown by radio frequency reactive sputtering method in order to be used as a gas sensor. Subsequently Pt has been added to the SnO2 films to increase the sensitivity to carbon monoxide gas. Two different substrates have been used: rough and mechanically polished alumina. The morphology of the film has been characterized by atomic force microscopy, whereas the chemical composition was analyzed by x-ray photoemission spectromicroscopy. Pt:SnO2 clusters with widths of 500-600 nm were observed on the rough alumina, whereas on the mechanically polished alumina, the Pt:SnO2 film was smoother. X-ray photoemission spectromicroscopy measurements show for Pt:SnO2 films on rough alumina substrates different charging in different areas of the sample. The response curve to carbon monoxide is 30% higher for rough alumina.
1996
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03 - FISICA DELLA MATERIA
English
atomic force microscopy
gas sensors
Cricenti, A., Generosi, R., Scarselli, M., Perfetti, P., Siciliano, P., Serra, A., et al. (1996). Pt:SnO2 thin films for gas sensor characterized by atomic force microscopy and x-ray photoemission spectromicroscopy. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B, 14(2), 1527-1530 [10.1116/1.589132].
Cricenti, A; Generosi, R; Scarselli, M; Perfetti, P; Siciliano, P; Serra, A; Tepore, A; Almeida, J; Coluzza, C; Margaritondo, G
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/309055
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