Deposition of thin and smooth nanocrystalline diamond films requires a high degree of control of the nucleation stage. The nature of the interface between diamond film and substrate is also important for some applications. The successive steps of the bias-enhanced nucleation (BEN) process are studied in-situ on Si(100) and 3C-SiC(100) using electron spectroscopies. Thin nanodiamond films (80-900 nm) have been achieved on Si(100). The formation of a thin covering SiC layer (2-3 nm) during the plasma exposure for parameters stabilization (PEPS) step leads us to study the plasma/surface interactions on 3C-SiC(100) surfaces. The C-terminated 3C-SiC(100) demonstrates a large inertia under microwave plasma (MP)CVD conditions. An enhancement of diamond nucleation on this surface is observed. Moreover, surface analysis reveals very little damage after BEN on 3C-SiC surfaces.
Arnault, J., Saada, S., Delclos, S., Rocha, L., Intiso, L., POLINI, R., et al. (2008). Surface science contribution to the BEN control on Si(100) and 3C-SiC(100): Towards ultrathin nanocrystalline diamond films. CHEMICAL VAPOR DEPOSITION, 14(7-8 SPEC. ISS.), 187-195 [10.1002/cvde.200706659].
Tipologia: | Articolo su rivista | |
Citazione: | Arnault, J., Saada, S., Delclos, S., Rocha, L., Intiso, L., POLINI, R., et al. (2008). Surface science contribution to the BEN control on Si(100) and 3C-SiC(100): Towards ultrathin nanocrystalline diamond films. CHEMICAL VAPOR DEPOSITION, 14(7-8 SPEC. ISS.), 187-195 [10.1002/cvde.200706659]. | |
URL: | https://onlinelibrary.wiley.com/doi/abs/10.1002/cvde.200706659 | |
IF: | Con Impact Factor ISI | |
Lingua: | English | |
Settore Scientifico Disciplinare: | Settore CHIM/03 - Chimica Generale e Inorganica | |
Revisione (peer review): | Esperti anonimi | |
Tipo: | Articolo | |
Rilevanza: | Rilevanza internazionale | |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1002/cvde.200706659 | |
Stato di pubblicazione: | Pubblicato | |
Data di pubblicazione: | 2008 | |
Titolo: | Surface science contribution to the BEN control on Si(100) and 3C-SiC(100): Towards ultrathin nanocrystalline diamond films | |
Autori: | ||
Autori: | Arnault, J; Saada, S; Delclos, S; Rocha, L; Intiso, L; POLINI, R; Hoffman, A; Michaelson, S; Bergonzo, P | |
Appare nelle tipologie: | 01 - Articolo su rivista |
File in questo prodotto:
File | Descrizione | Tipologia | Licenza | |
---|---|---|---|---|
ChemVapDeposition_2008_14_187.pdf | Articolo principale | Versione Editoriale (PDF) | Copyright dell'editore | UNIVERSITY_NETWORK Richiedi una copia |